Facebook Icon
Instagram Icon
Linkedin Icon
Twitter Icon
Youtube Icon
Register
Login
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT500
High-Res, Large-Chamber SEM
JSM-IT500HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-7900F
JSM-7610FPlus
JSM-F100
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEOL Cryo TEMs for Structural Biology
300 kV
JEM-ARM300F
CRYO ARM™ 300
JEOL Cryo TEMs for Structural Biology
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
JEM-2200FS
Tomography Solution
SerialEM Tomography Software
IMOD Tomography Software
Chimera Visualization Software
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Nuclear Magnetic Resonance
JNM-ECZS
JNM-ECZR
Probes
ROYAL Probe
ROYAL HFX Probe
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Walkup NMR
Magnets
Sample Changers
NMR Basics
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF DART Application Notes
AccuTOF GCx-plus
AccuTOF GCx Design Features
AccuTOF GCx Tuning Assistant Function
EI/FI/FD Combination Ion Source for AccuTOF GCx
AccuTOF GCx Technology
AccuTOF GCxGC MS
AccuTOF LC-Plus
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
InfiTOF
MALDI Imaging SpiralTOF
MALDI SpiralTOF TOF/TOF
SpiralTOF Ion Optics
Spiral TOF Monoisotopic Precursor Ion Selection
Spiral TOF MALDI Target Plates
Spiral TOF Configurations
MStation
Microprobe (EPMA) and Auger
JAMP-9510F
JXA-8530FPlus
JXA-8230
Soft X-Ray Emission Spectrometer
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
ElementEye JSX-1000S
Soft X-ray Emission Spectrometer
Correlative Microscopy Solutions
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
EB Source Power Supply
Plasma Source
Electron Beam Source
Rotary Sensor
APPLICATIONS
Application List
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Neuroscience
Semiconductor
Application List By Product
SEM Applications
TEM Applications
FIB Applications
NMR Applications
Mass Spec Applications
Sample Preparation Applications
REALab Customer Stories
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
Links & Resources
Mixed Media
Analytical Instruments
Documents & Downloads
Image Gallery
NMR Magnet Destruction
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Mixed Media
JEOL Periodic Table App
JEOL Posters / Calendars
SERVICE / SUPPORT
JEOL USA Service & Support
JEOL Financial Services
JEOL Field Service
JEOL Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
JEOL Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
What's New
JEOL USA Image Contest Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
JEOL USA Image Contest Entry Form
JEOL in the News
Press Releases
Events & Shows
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
BLOG
ABOUT US
The Company
Career Opportunities
Working at JEOL
Corporate Benefits
Current Career Opportunities
Submit Application
JEOL USA Technology Centers
History of JEOL
Milestones
Management Team
FAQs
CONTACT US
JEOL USA Headquarters
JEOL Regional Web Sites
Find a Local Sales Rep
Electron Microscopy
ESR, NMR, Mass Spectrometry
EB Lithography (Direct Write)
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
Search Button
Button
NEWS & EVENTS
/
JEOL in the News
JEOL in the News
Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures
February 15, 2012
1351
Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures
