JEOL USA Press Releases

New Solution for Automated NMR Sample Exchange

Peabody, Mass., July 15, 2005 – JEOL USA, Inc. has developed a unique solution for rapid, automated NMR spectrometer sample exchange. The new ASC24 24-position sample changer allows programmable, random order selection of sample tubes, improving NMR workflow for remote or unattended operation. An Ethernet interface enables plug and play installation, and controls are automatically updated whenever upgrades to the operating software, DELTA™, are installed. The lightweight aluminum carousel is interchangeable, making it possible to ...

JEOL Displays Latest Imaging Solutions for Process Analysis at Semicon West 2005

Peabody, Mass., June 16, 2005 – JEOL will present a suite of solutions for critical analysis of wafer defects and nanometric designs at Semicon West 2005. From precision sample preparation to ultrahigh resolution imaging at the nanoscale, JEOL semiconductor tools are designed for today’s most advanced processes. Cross Section Polisher Sample Preparation On display in the Final Manufacturing section of Semicon West is JEOL’s new cross section polisher for scanning electron microscope (SEM) sample prep. ...
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