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Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

New Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

August 1, 2022 (M&M 2022 Portland, Oregon) JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the entire EDS range produced from the IT800 series Field Emission SEMs including low-energy X-rays down to Lithium. It is fully ...
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