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JEOL is ready to demonstrate the latest advances in our SEM, TEM, and EPMA technology and for 2020 we’ve gone virtual!

Proceed to Microscopy & Microanalysis 2020 Virtual Meeting

Scanning Electron Microscopes

We are proud to demonstrate the latest evolution in Analytical Intelligence Field Emission SEM technology with ultrahigh resolution. The new JSM-IT800 is our top-of-the-line Field Emission microscope that delivers ultrahigh spatial resolution imaging and analysis at the nanoscale.

Our comprehensive lineup of Scanning Electron Microscopes ranges from the versatile NeoScope Benchtop SEM to our variable pressure tungsten SEMs with large specimen chamber, and our top-of-the-line ultrahigh resolution FE SEMs. 

Our applications experts will show you just how easy our SEMs are to operate, using your samples for a real time virtual experience.

Schedule a Demo

Transmission Electron Microscopes

Don’t miss out on seeing our popular 120kV TEM, the JEM-1400Flash, optimized for imaging of biological and light material samples. It fully integrates viewing, processing and archiving of TEM data. A newly-installed JEM-1400Flash TEM will be available online at Delta College for a full demo experience.

We celebrate 10 years since the most powerful Atomic Resolution TEM was installed in the U.S. and now offer the GrandARM2 with even more stability and performance.

Schedule a Demo

 
EPMA

JEOL EPMA has a whole new look and functionality – these are the most advanced microprobes available with new interface and “Easy EPMA” workflow.

Monday, August 3, 12:00 - 1:30 PM Central Standard Time (CST)

Tutorial
SEM and EDS Basic Theory
Dave Edwards
Register here: https://attendee.gotowebinar.com/register/6487171788975665422

Tuesday, August 4, 1:00 - 2:30 PM Central Standard Time (CST)

IDES and JEOL - Exploring TEM Phenomena from Milliseconds to Femtoseconds
Dr. Dan Masiel
Register here: https://attendee.gotowebinar.com/register/2405022665184565263

Tuesday, August 4, 3:00 - 4:00 PM Central Standard Time (CST)

Webinar (30 minute presentation followed by 30 minutes for Q&A)
The CRYO ARM Family of Microscopes
Dr. Jaap Brink
Register here: https://attendee.gotowebinar.com/register/365325241389905679

Wednesday, August 5, 11:30 - 12:30 PM Central Standard Time (CST)

Remote Demonstration of the JEM-1400Flash TEM
Thanks to the support of Delta College for use of their microscope
Kevin McIlwrath
Register here: https://attendee.gotowebinar.com/register/4576294247074985742

Wednesday, August 5, 3:00 - 4:00 PM Central Standard Time (CST)

Webinar (30 minute presentation followed by 30 minutes for Q&A)
The New JEOL Grand ARM2: High-Performance Analytical S/TEM
Dr. Patrick Phillips
Register here: https://attendee.gotowebinar.com/register/8124008152072074768

Thursday, August 6, 11:30 - 12:00 PM Central Standard Time (CST)

Presentation 
High Resolution on the CRYO ARM:  Past, Present and Future
Dr. Jana  Ognjenovic, NIH
Register here: https://attendee.gotowebinar.com/register/1499086656372950288

Friday, August 7, 12:00 - 1:00 PM Central Standard Time (CST)

Remote Demonstration of the JEM-1400Flash TEM
Thanks to the support of Delta College for use of their microscope
Kevin McIlwrath
Register here: https://attendee.gotowebinar.com/register/4576294247074985742

Tuesday, August 4, 1:30 - 2:45 PM Central Standard Time (CST)

Platform Presentation A08.1
23 - Time Resolved SEM-SXES Analysis for Lithium Material
Yasuaki Yamamoto

Tuesday, August 4, 4:30 - 6:00 PM Central Standard Time (CST)

Poster A02.P1
84 - Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
Ryusuke Sagawa

Wednesday, August 5, 3:30 - 5:00 PM Central Standard Time (CST)

Poster A08.P1
491 - High Accuracy EDS Chemical Mapping Using High Speed Clustering Analysis
Atsuhiro Fujii

Thursday, August 6, 4:00 - 5:30 PM Central Standard Time (CST)

Poster P02.P1
925 - Atomic-Resolution Imaging of Graphene Using an Ultrahigh-Vacuum Microscope with a High-Brightness Electron Gun
Hidetaka Sawada

Friday, August 7, 10:00 - 11:15 AM Central Standard Time (CST)

Platform Presentation A04.4
1212 - Development of Ultrahigh Resolution Objective Lens Enabling High Analytical Sensitivity
Yu Jimbo

Friday, August 7, 1:00 - 2:30 PM Central Standard Time (CST)

Poster A14.P1
1063 - "Integrated EPMA" with New Multifunction Technology
Koki Kato