JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Cryo-Electron Ptycography: Applications in the Characterisation of Biological Samples
    • Current Status and Future Development of In-situ Liquid Cell Transmission Electron Microscopy
    • Broad Ar Ion Beam Milling Improves EBSD Analysis of Phyllosilicates
    • Complete Classification, Separation, and Accurate Analysis of Fragment Ions Produced by Electron Ionization of Methyl Stearate using a High-Performance Mass Spectrometer
    • Observation of Radicals in Clathrate Hydrates and Silica Clathrates
    • Microstructure Analysis of Carbon and Nitrogen in Nitrocarburized Carbon Steel Using EPMA Scatter Diagram Method
    • Crystal Structure Elucidation of Small Organic Molecules: Combined Approach of 3D Electron Diffraction and SOlid-State NMR
    • Operando Observation Using an In-situ Gas Reaction System Connected to a Transmission Electron Microscope (TEM) and a Mass Spectrometer (MS)
    • Development of JBX-A9, Electron Beam Lithography System
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 45 No. 1, July 2010

• Lithium Atom Microscopy at Sub-50pm Resolution by R005
• Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
• Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
• Ultrahigh-Resolution STEM Analysis of Complex Compounds
• Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
• JEM-2100: Applications in Nanotechnology
• Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
• Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
• Micro Area Analysis with JXA-8530F (FE-EPMA)
• Analysis of Insulator Samples with AES

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