JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)

Vol. 52 No. 1, July 2017

Revealing the Atomic Structure of Two Dimensional and Three Dimensional Defects by Aberration Corrected Scanning Transmission Electron Microscopy; Quantitative STEM-EELS Characterizations of Oxide Superlattices and Atomic-Scale Electron Spectroscopy at 100 K at National Taiwan University; High Spatial Resolution Scanning Electron Microscope: Evaluation and Structural Analysis of Nanostructured Materials; A Top-Down Drawing of the World’s Smallest National Flag by JBX-6300FS Electron Beam Lithography System; High Temporal Resolution Analysis of Materials Nanoprocess by Materials- and Bio-Science Ultra-High Voltage Electron Microscope at Osaka University; A Quantitative Analytical Method "Effective Magnetic Moment Method" Based on Both Curie-Weiss Law and ESR Fundamental Equation; Introduction of a Next-Generation 200 kV Cryo TEM; Development of Pixelated STEM Detector "4DCanvas"; Development of a New Field Emission Electron Probe Microanalyzer JXA-8530FPlus; JMS-MT3010HRGA INFITOF, a High Resolution Time-of-Flight Mass Spectrometer (TOF-MS) for Gas Monitoring Analysis; The Development of the ROYAL HFX Probe; Latest Technologies of Electron-Beam Vacuum Deposition Used for Film Formation; New-Generation Analyzer BioMajesty™ Zero Series, JCA-ZS050, and Its Contribution to Clinical Analysis; Introduction of New Products;

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