TEM for Cryomicroscopy


TEM for Cryomicroscopy JEM-1400Flash

The JEOL JEM-1400 series 120kV Transmission Electron Microscope is widely accepted for its ease of use and high resolution imaging and analysis. Applications include pathology, biology, quality control, nanotechnology, polymer, and materials development.

Introduced in 2017 and derived from the highly successful JEM-1400(Plus), the JEM-1400Flash makes it easier for the user to first view samples at low magnification before studying the fine structures of interest at high magnification. To smoothly transition from low to high magnification and acquire higher-throughput image data, the JEM-1400Flash has an integrated high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function. To increase the throughput, the JEM-1400Flash is equipped with a TMP, which besides resulting in an oil-free column vacuum, also allows for instantaneous sample exchanges.

The JEM-1400Flash features high resolution/high contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography, and montaging. A compact, easy-to-use TEM, it supports optional STEM digital imaging/scanning circuitry with STEM images (BF/DF) on the standard GUI.

New features of the JEM-1400Flash include:

High-sensitivity sCMOS camera, "Matataki Flash" camera

"Matataki Flash," JEOL's innovative high-sensitivity sCMOS camera, dramatically reduces the readout noise while possessing high frame rate. This powerful feature enables high-throughput acquisition of high quality TEM images with extremely low noise.

Ultra-wide area montage system, Limitless Panorama (LLP)

In addition to the conventional electromagnetic image shift, the JEM-1400Flash comes with a montage system capable of utilizing the stage drive for the field of view shift. This new system allows for capture of a montage panorama image over a limitless wide area. Thus, an ultra-wide area, high pixel-resolution image is obtainable that can be used to navigate the entire grid in the case of a grid-sized montage. An unlimited number of frames can be acquired with the "Limitless Panorama" option.

Picture Overlay (OM image linkage function)

For Correlative Light and Electron Microscopy (CLEM) workflows a digital image acquired with an OM can be overlaid on a TEM image. This technique allows for the combination of the spatiotemporal information from a fluorescence light microscope with high-resolution structural data from a TEM. Thus, CLEM bridges information from cells and structural biology that can be extended to the combined use of high-resolution markers for more precise targeting of relevant fluorescent loci.

New user interface

In addition to a new exterior finish, new designs are also employed for (1) knob sets with OLED-equipped buttons definable by the user for easy-to-view operation, (2) a touchscreen for intuitive operation, and (3) a new Graphical User Interface. The new JEM-1400Flash is fully compatible with SerialEM for tomography and SPA workflows.

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As described in Physics World, JEOL's large angle SDD EDS with large solid angle was used to detect single atoms within a nanostructure. The research was published in Nature Photonics.

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Key Features

  • Compact footprint and simplified GUI with multitouch screen for optimal ease of use
  • Optimized for high contrast imaging for biological, low Z, and materials science applications
  • +/- 70º tilt with support for dual axis tomography
  • Automated tomography from multiple points
  • Limitless Panorama ultra-wide area montaging
  • TMP with instantaneous sample exchange
  • STEM and large area SDD-EDS available
  • 5-axis Microactive Goniometer, supports cryo holders
  • Remote operation and data viewing for collaboration
  • LaB6 emitter standard

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