JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
      Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
      Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
      Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
      Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 53 No. 1, July 2018

• Fast Pixelated Detectors: A New Era for STEM
• Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
• Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
• Electronic State Analysis by Monochromated STEM-EELS
• Chemical State Analyses by Soft X-ray Emission Spectroscopy
• X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
• Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
• Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
• Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
• Development of the JBX-8100FS Electron Beam Lithography System

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