JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
      Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
      Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
      Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
      Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 54 No. 1, July 2019

• Atomic-Resolution Imaging and Spectroscopy on Materials of Various Dimensions by Aberration-Corrected Scanning Transmission Electron Microscopy
• Probe Corrected STEM Structural Imaging and Chemical Analysis of Materials at Atomic Resolution
• Analytical SEM and TEM: Applications in Product-related Material Development
• Practical Solutions in Electron Beam Lithography with the JBX-9500FS and the JBX-6300FS
• Development of New Operando Measurement System by Combining Reaction-Science High-Voltage Electron Microscopy and Quadrupole Mass Spectrometry
• Development of Low-Voltage TEM/STEM for Single Carbon Atom Analysis under the 3C Project
• High-Field DNP Using Closed-Cycle Helium MAS System
• Application of "operando -ESR" to Organic Electronics Materials
• YOKOGUSHI (Multifaceted) Analysis of Biomimetic Materials by Using PyGC/MS and XPS
‒ Characterization of Biomimetic Lacquer ‒
• Development of Cryo High-Resolution Transmission Electron Microscope CRYO ARM™ 300, Equipped with Cold Field Emission Gun for Structural Biology
• Observation and Analysis at Low Accelerating Voltage Using Ultra High Resolution FE-SEM JSM-7900F
• Development of an Integrated Analysis Method for the JMS-T200GC High Mass-Resolution GC-TOFMS by Electron Ionization and Soft Ionization Methods
• Development of a Gas Chromatograph Triple Quadrupole Mass Spectrometer JMS-TQ4000GC

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