JEOL USA Elemental Analysis

Accessories:

Embedded EDS for SEM

From our benchtop SEM to our highest-resolution FE SEM, we offer an EDS spectrometer designed by JEOL exclusively for each model of JEOL Scanning Electron Microscope.

Gather-X Windowless EDS

Higher Sensitivity and Low-energy X-Ray Detection down to Lithium.

Soft X-ray Emission Spectrometer (SXES)

Analytical Optimization. Utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays).