JEM-1400 Transmission Electron Microscope

JEM-1400The JEM-1400 is a high performance, high contrast, 120kV TEM with excellent imaging and analytical capabilities in one compact, easy-to-use instrument. With an acceleration voltage of 40 to 120kV, the JEM-1400 is suitable for biological, polymer and materials science applications.

The new JENIE™ software included with the JEM-1400 offers a set of tutorials and user guides designed to help beginning microscopists familiarize themselves with the microscope, but also allows experienced users to explore and understand advanced features. The Windows™ GUI is programmed with the latest in Windows™ based technologies and allows remote operation and communication between groups via a TCP/IP connection and a web browser.

The JEM-1400 also supports optional STEM digital imaging/scanning circuitry which displays STEM images (BF/DF) on the standard GUI. An EDS can be added for elemental mapping.

For a bibliography of papers and proceedings published on JEOL CryoTEM instruments and capabilities, please contact us.

JEM-1400 Key Product Features

  HC
High Contrast
STEM
Resolution
Lattice Image
Point Image

0.20nm
0.38nm

0.20nm
0.38nm
Accelerating Voltage
Steps (5)
Variable Steps
Stability

40 - 120 kV
33 V min. step
2 x 10-6/min.
Magnification
Mag Mode
Low Mag Mode
SA Mag Mode

x200-1,200,000
x50-1,000
x2,000-300,000

x1,000-600,000
x50-1,000
x2,500-300,000
Camera Length
SA DIFF
HD DIFF

150-3,500mm
4-80m

15-3,000mm
4-80m
Condenser Lens
C.L. (gaps)
Spot Size
Min. Probe Dia.


2-stage (single)
5-step
0.2µm


3-stage (double)
5-step
50nm
Specimen Stage Microactive goniometer with Piezo drives
Specimen Chamber
Specimen per Load
Specimen Tilt Angle (X-axis)

1
±25° (±70° with optional holder

1
±30° (±70° with optional holder)
Specimen Movements
X Direction
Y Direction
Z Direction

±1.0mm
±1.0mm
±0.5mm

note: configuration must be chosen at time of purchase.