JEOL USA Transmission Electron Microscopes

JEOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since.
JEOL innovations in TEM/STEM technology range from extreme ultrahigh-resolution optics that enable atom-to-atom imaging and single particle analysis, as well as analytical characterization to the picometer level.

TEM for the Life Sciences

JEM-1400Flash

Imaging and Cryomicroscopy Excellence in a Compact 120kV TEM

JEM-2100 Plus

Multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership.

JEM-F200 "F2"

Advanced analytical, high throughput 200kV S/TEM with Cold Field Emission Gun and dual Silicon Drift Detectors

CRYO ARM™ 200

Automatic acquisition of image data for Single Particle Analysis - 200kV

CRYO ARM™ 300 II

Specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED - 300kV

TEM for Materials Science

JEM-1400Flash

Imaging and Cryomicroscopy Excellence in a Compact 120kV TEM

JEM-2100 Plus

Multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership.

JEM-F200 "F2"

Advanced analytical, high throughput 200kV S/TEM with Cold Field Emission Gun and dual Silicon Drift Detectors

JEM-ARM300F2 GRAND ARM™2

World's Highest Resolution in a Commercially-Available TEM - 300kV

NEOARM

Atomic Resolution TEM with (Cold-FEG) and next-generation Cs corrector (ASCOR)

TEM for Special Materials Applications

JEM-ACE200F

Automated, high-throughput S/TEM designed to meet the unique demands of semiconductor device development and manufacturing.
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