Electron Optics Image Gallery
- Harvard 3D Imaging Using SEM
- Search for the Third Dimension - Stereomicroscopy 101
FEG Collection - Full Field of View (FOV)
Anodized aluminum film, uncoated SEI image
Carbon nanotube, SEI image, courtesy of Yury Gogotsi, Dreexel University.
Channeling contrast image of annealed Au film.
Uncoated diatoms on filter paper, SEI image.
Fractured hammer claw, pearlite region, SEI image.
Au-labled hydroxyapatite, r-filter image showing Z-contrast.
Low mag SEI image of a bee.
In-lens BEI image of Pd (Palladium) catalyst on SiO2 carrier.
High mag, in-lens BEI of Pd (Palladium) catalyst on ZrO2 carrier.
Fracture surface of recrystallized glass.
r-Filter image showing Z-contrast of semiconductor cross-section.
Cross-section SEI image of stained transistor.
Uncoated photoresiston glass mask at 75° tilt.
TiO2 (titanium dioxide) particles, SEI image.
Brightfield STEM image of semiconductor cross-section.