Harvard 3D Imaging Using SEM
PRISM - Practical Remote In Situ Microscopy
Live 3D imaging for intuitive knowledge of sample surface shape
Seamless navigation with ZeroMag – Plus live EDS analysis
JSM-IT800 Series Ultrahigh Resolution Field Emission SEM
JEM-ACE200F High Throughput Analytical Electron Microscope
JSM-IT700HR InTouchScope™ SEM
LabTube Meets JEOL NeoScope™ Benchtop SEM
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An automated, high-throughput S/TEM designed to meet the unique demands of semiconductor device development and manufacturing.