Electron Optics Product Presentations

Live-time DRAM Map analysis using Large Angle SDD-EDS mounted on JEOL ARM200

Large Analytical Chamber SEM - Rotation and Tilt

Large Analytical Chamber SEM - Will my samples fit?

Easy Filament Replacement in the JEOL NeoScope

 Zeromag

Live Analysis

JSM-IT800 Series Ultrahigh Resolution Field Emission SEM

LabTube Meets JEOL NeoScope™ Benchtop SEM

JEM-F200 Multi-purpose Electron Microscope

Callum Dickenson JEOL JEM-F200 F2

Harvard 3D Imaging Using SEM

PRISM - Practical Remote In Situ Microscopy

Dynamic Thermal Studies

Nanomanipulation

JEM-ACE200F High Throughput Analytical Electron Microscope

Seamless navigation with ZeroMag – Plus live EDS analysis

Live 3D imaging for intuitive knowledge of sample surface shape

JEOL's CRYO ARM

JSM-IT700HR InTouchScope™ SEM