JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Nanoscale Positioning Highly Coherent Spin Defects in Diamond Using JBX-8100FS
    • Development of a Semi-Automated 3D ED/MicroED System and Its Operation as a Shared-Use Facility
    • Structural Analysis of AMorphous Alumina Using Nuclear Magnetic Resonance Spectroscopy
    • High-Resolution STEM Image Acquisition Method for Tilted Specimen Using a New Type of Aberration Corrector
    • Structure Solution of Nano-Crystalline Powder: A YOKOGUSHI Approach of SynergyED, HRMS, NMR, and Computation
    • Toward Full Automation of Scanning Electron Microscopy: Automating Specimen Exchange and Measurement with Neo Action Robo
    • Introduction of In-situ Charge-Discharge Cycle System and Battery Application
    • Expansion of Crystal Orientation Analysis in Entry-Level SEM
    • Development of an Electron Spectroscopy System (f-HSA) and Its Application to High-Speed Spectrum Imaging
    • Development of an Ultra-Low Temperature Solid-State DNP-NMR System Using a Compact Microwave Source
    • Analysis of Metabolites in HeLa Cells Using GCxGC-TOFMS and Unknown Compounds Structure Analysis Software msFineAnalysisAI

JEOL NEWS Magazine (previous issues)

Vol. 60 No. 1, June 2025

• The Crucial Role of the Elelectron Microprobe in Solving Micro-Analytical Problems in Earth Sciences and Archaeometry
• Three-Dimensional Digital Structural Analysis of Olfactory Neural Circuits - Exploring possibilities of biological analyses by electron microscopy
• Novel Cellular Structures and Physiological Traits of Novel Phyla Bacteria Revealed by Cryo-Electron Microscopy
• X-ray and Electron-Beam Analyses for Teeth of Chiton Accumulating Iron at High Concentrations
• Time-Resolved ESR Method for Observing Rapid Radical Reactions
• JEM-120i, a 120 kV Transmission Electron Microscope with Compact Appearance and Ease of Use - Its Features and Applications
• Progressing from Easy to Automatic - Overcoming Challenges of Automation with the Latest FE-SEM JSM-IT810
• Development of a Large Solid-Angle Windowless EDS Detector "Gather-X" Used with a Field Emission Scanning Electron Microscope (FE-SEM)
• Introduction of the New Cryo-FIB-SEM "CryoLameller"
• Advancement of Technological Development of an Electron Beam Metal 3D Printer JAM-5200EBM
• Introduction of JEOL Products

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