Recent Blogs

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Carrying out Nanostructural Analysis with Focused Ion Beams

Focused ion beam technologies are considered to be the newest field of electron microscopy, being used for nanostructural analysis. Read on.
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A Quick Introduction to Triple-Quadrupole Mass Spectrometry

Triple-quad mass spectrometry technology was invented by Christie G. Enke and Richard A. Yost in the late 1970’s. Here's all you need to know.
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TEM vs. SEM Imaging: What's the Difference?

The key difference between SEM imaging and TEM is that SEM produces an image by detecting secondary or backscattered electrons, whereas TEM uses transmitted electrons to form an image.