JEOL USA Focused Ion Beam

JEOL’s new JIB-PS500i FIB-SEM offers the cutting edge in sample preparation, imaging and analysis. This multipurpose FIB-SEM features a large chamber/stage and TEM-Linkage enables a new high-throughput, robust workflow from specimen preparation to TEM imaging.  
The JIB-4000PLUS is a focused ion beam milling & imaging system (single-beam FIB system) featuring a high-performance ion optical column. The accelerated Ga (gallium) ion beam is focused onto a specimen to enable SIM image observation of the specimen surface, milling, and deposition of materials like carbon or tungsten. The system also enables preparation of a thin-film specimen for TEM imaging and a cross-section specimen for observing the interior of the specimen. In addition, the JIB-4000PLUS can be equipped with a 3D observation function and an automatic TEM specimen preparation function; thus the system meets a variety of needs for specimen preparations.
Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed the JIB-4700F Multi Beam System and the to be used in morphological observations, elemental and crystallographic analyses of a variety of specimens.

Instruments:

JEOL offers three solutions for Focused Ion Beam milling.

JIB-PS500i

CRYO-FIB-SEM

This CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for frozen specimens, making it possible to prepare TEM specimens such as biopolymers.
JIB-PS500i

JIB-PS500i

A multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument.
JIB-4700F

JIB-4700F

Combines SEM with FIB column for high-resolution SEM observation and analysis after high-speed cross-section milling with FIB.
JIB-4000PLUS

JIB-4000PLUS

Focused ion beam processing and observation system (single-beam FIB system) featuring a high-performance ion column.

Applications:

Please see our list of applications specific to Focused Ion Beam.
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