p: (978) 535-5900     e: salesinfo@jeol.com

JEOL Benchtop SEMs

  • High Vacuum: Ideal for failure analysis, inspection, and characterization.
  • Low Vacuum: For imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Available Models

  Resolution Accelerating
Magnification Stage
Benchtop SEM
  15 kV, 10 kV, 5kV
(3-position switch)
(printed as a 128mm x 96mm micrograph)
Manual control for X and Y
X: 35mm, Y: 35mm