p: (978) 535-5900     e: salesinfo@jeol.com

JSM-7200F/LV All-in-One FE-SEM

The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7200F dramatically increases analytical resolution to the sub 100nm scale.

From Magnetic to Neuroscience Samples

For the lab using multiple analytical techniques or requiring special capabilities, the JSM-7200F is available with low vacuum operation (JSM-7200F/LV). The LV capability is suited for non-conductive samples and for enhanced high resolution imaging of nanostructures, specimen surface details, and magnetic samples. 

For neuroscience applications, the JSM-7200F/LV with integrated Gatan 3View® Serial Block Face Imaging System creates perfectly aligned image stacks of thousands of sequentially-imaged slices of the freshly cut, resin embedded block face sample.

Versatile Performance

The JSM-7200F/LV is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, STEM, BSE, and CL. A new Soft X-ray Emission Spectrometer allows efficient and parallel collection of very low-energy rays (WDS) with chemical state analysis. The system can also be equipped with a variety of sub stages including tensile, heating and cooling stages for in situ experimentation. 

The JSM-7200F employs a newly designed hybrid conical objective lens that is a combination of electromagnetic and electrostatic lenses and through-the-lens electron detectors with energy filter allowing the selection of topography, Z contrast or a mix of the two. With no electromagnetic leakage below the lens, it is ideal for imaging magnetic samples and analyzing samples with EBSD. With the integration of in-the-lens acceleration and deceleration of the electron beam, low kV aberrations are reduced, yielding higher resolution at the lowest accelerating voltages.

JEOL's proven beam deceleration mode (GB Mode) decreases charging on nonconductive specimens, improves spot size at low kV, and enhances surface topography.

JSM-7200F Details

  • The thermally-assisted Schottky gun maintains long-term beam stability for analysis as well as high beam current, high resolution, and low kV high resolution imaging. 
  • Through-the-lens detectors with energy filter
  • In-lens field emission gun
  • An aberration correction lens (ACL) automatically optimizes both small probe current spot size for high resolution imaging and spot shape for high beam current, high resolution microanalysis.
  • A beam deceleration mode curtails charging on nonconductive specimens such as ceramics, semiconductors and polymers. 
  • The objective lens forms no magnetic field around the sample, so magnetic samples can be analyzed without restriction.