Argon Beam Cross Sectioning October 20, 2020 Operation of CP, Sample Preparation 0 The new specimen preparation apparatus, the Cross Section Polisher (CP), utilizes a broad argon ion beam that eliminates problems associated with the conventional methods of specimen cross sectioning for SEM. The CP consists of a specimen chamber with a TMP vacuum system, an optical microscope for specimen positioning, and controllers for the vacuum system and a stationary ion beam. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. amp_article.pdf 326.15 KB Showing 0 Comment Comments are closed.