Sample Preparation Equipment Documents

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JEOL Resources

Documentation in support of your JEOL product.

Clean Cross Section Preparation with the SM-09010 Cross Section Polisher

The cross section polisher (CP), which is supported by the patented technology developed by JEOL, makes a cross section perpendicular to the surface of a specimen. This is suitable for measurement of multi-layered structures.

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Other Resources

The following resources are available concerning Sample Preparation related instruments:

  • Image Gallery
    -View a selection of Cross Section Polisher images
  • Mixed Media
    -View our series of videos on the use of the Cross Section Polisher