Clean Cross Section Preparation with the SM-09010 Cross Section Polisher October 20, 2020 Operation of CP, Sample Preparation 0 The cross section polisher (CP), which is supported by the patented technology developed by JEOL, makes a cross section perpendicular to the surface of a specimen. This is suitable for measurement of multi-layered structures. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. CSP.pdf 443.7 KB Related Articles Preparation of a High Quality Cross Section of a Bone Tissue for SEM - Application of the Cross-section Polisher to a Biological Specimen A bone tissue of a mouse tail, composed of hard and soft materials, was polished with the Cross-section Polisher (CP) for obtaining wide and smooth cross-section. The prepared specimen was observed with a SEM and analyzed with an EDS. Pristine Sample Preparation Using Broad Ion Beam Traditional mechanical preparation of specimen surfaces suffers from various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information and precise layer thickness measurements. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. CP is a tabletop instrument that is ideally suited for preparation of a variety of environmentally-sensitive and beam-sensitive materials, including metals, polymers, ceramics and composites. The instrument includes both cryo-preparation (down to LN2temperature) and air-isolated transfer and preparation environment. Ion beam sputter coating with CROSS SECTION POLISHER™ CROSS SECTION POLISHER™ (CP) is an SEM specimen preparation device that utilized broad Ar ion beam to produce artifact-free cross-sections. The same principle can be employed not only for ion-milling but also deposition of thin layer to the specimen surface, in particular conductive coating for followup observation of a non-conductive specimen in an SEM. New Cross-Section Sample Preparation Method Applied to Microstructural and Chemical Investigation of Steel Coatings using FE-SEM Steel strips coated with Al-43.5Zn-1.5Si (Galvalume) alloy exhibit superior corrosion resistance as compared to Zn galvanized steel strips. The continuous hot-dip coating process used to produce such coatings entails a metallurgical reaction between the steel strip and Al-Zn-Si liquid alloy that leads to formation of an intermetallic compound layer at the steel-coating interface. Formability of the coated strip depends strongly on the morphology, dimensions (thickness) and chemical nature of this intermetallic layer. Proper characterization of the intermetallic layer structure and chemistry and the nucleation sites on the steel surface is therefore of paramount importance for the development of formable Galvalume coated steel strips. This requires preparation of artifact free cross-sectional samples. Such samples can be obtained using JEOL Cross-section Polisher (CP). Unlike mechanical sample preparation techniques that introduce significant amount of strain and possible artifacts due to preferential etching of various constituents, the CP uses a broad Ar beam and a rocking stage that minimize possible preferential etching and produces strain free cross-sections. In this paper, SEM images as well as chemical (EDS) data characterizing the interface layer between the steel strip and the Galvalume coating prepared using Cross-sectional Polisher are presented. Handle with care – preparing sensitive samples Here we look at three types of samples that require a more precise cross sectioning technique than traditional methods: Lithium Ion battery, pharmaceutical tablet, and Zn thin film. For each, scientists need to examine a very thin multilayered “sandwich” of different materials. Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM Scanning Electron Microscopes (SEMs) have been used for various applications, such as research and development and failure analysis. There are many cases where not only observation of a specimen surface – but also observation of a cross section – is important. Preparation of a cross section depends on the specimen structure, observation purpose, and materials. Various preparation methods are put into practice: cutting, mechanical polishing, microtome, and FIB (Focused Ion Beam) are the major methods. In this discussion, we evaluate a new cross section specimen preparation method using an argon ion beam (hereinafter called the Cross-section Polishing or CP method). We have found that this method is extremely useful for observation of layer structures, interfaces, and crystalline structures of metals, ceramics, and composites. Here, we introduce examples of applications to various types of specimens. Showing 0 Comment Comments are closed.