JEOL Smart Coater October 20, 2020 JEOL Smart Coater, Sample Preparation 0 JEOL’s Smart Coater is simple to use with fully automated vacuum and sputtering. Insert your samples, turn the unit on and select the sputtering time. The chamber will evacuate and sputtering will begin automatically. When the unit is powered down, it vents to atmosphere. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. PN-JEOL-Smart Coater-0414-1.pdf 168.91 KB Related Articles Carbon Coater (EC-32010CC) JEOL’s Carbon Coater is a sample preparation device that evaporates carbon to create a conductive thin film on the sample surface. Thin film conductive coatings are effective in eliminating charging with non-conductive materials. Carbon has an advantage over heavy metal coatings (Ex. Gold or Platinum) for X-ray applications (EDS/WDS), CL or backscatter electron imaging due to its inherent low absorption characteristics. Pristine Sample Preparation Using Broad Ion Beam Traditional mechanical preparation of specimen surfaces suffers from various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information and precise layer thickness measurements. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. CP is a tabletop instrument that is ideally suited for preparation of a variety of environmentally-sensitive and beam-sensitive materials, including metals, polymers, ceramics and composites. The instrument includes both cryo-preparation (down to LN2temperature) and air-isolated transfer and preparation environment. Designing Better Batteries Through Innovative Microscopy Characterization Scanning Electron Microscopes (SEM) support the development of new LIB technologies with morphological observation at the micrometer to nanometer scale, as well as the chemical analysis needed to create high-performance coatings and powders. Ultra-low voltage imaging combined with signal filtering in the SEM allows direct imaging and analysis of battery constituents (anode and cathode) with nanometer resolution. Additionally, one of the important aspects of the analysis is the ability to probe chemistry of the constituents at nm scale (Fig. 1). JEOL FESEM offers the ability to perform microanalysis with energy dispersive spectroscopy (EDS) at extremely low voltages to pinpoint localized makeup of the specimens and, in particular, low atomic number materials such as carbon and fluorine. Moreover, the unique JEOL Soft X-ray spectrometer (SXES) allows researchers to analyze Li. Handle with care – preparing sensitive samples Here we look at three types of samples that require a more precise cross sectioning technique than traditional methods: Lithium Ion battery, pharmaceutical tablet, and Zn thin film. For each, scientists need to examine a very thin multilayered “sandwich” of different materials. Air-Isolated Sampling of Solid-State Battery for TEM A solid-state battery is made of cathode, anode and electrolyte. This type of battery doesn’t use liquid state electrolyte, so it tends to avoid the issues associated with leakage of electrolyte and ignition/explosion. Recently, silicon has been used as an anode material to improve the battery charge capacity (can store ten times more charge as compared to graphite anodes), but some challenges remain in terms of volume expansion during cycling, low electrical conductivity, and instability of the SEI (solid electrolyte interphase) layer caused by repeated volume changes of the Si material. Clean Cross Section Preparation with the SM-09010 Cross Section Polisher The cross section polisher (CP), which is supported by the patented technology developed by JEOL, makes a cross section perpendicular to the surface of a specimen. This is suitable for measurement of multi-layered structures. Showing 0 Comment Comments are closed.