Pristine Sample Preparation Using Broad Ion Beam February 18, 2021 Sample Preparation 0 New High Throughput Milling System – Cross Section Polisher Traditional mechanical preparation of specimen surfaces suffers from various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure, crystallographic information and precise layer thickness measurements. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. CP is a tabletop instrument that is ideally suited for preparation of a variety of environmentally-sensitive and beam-sensitive materials, including metals, polymers, ceramics and composites. The instrument includes both cryo-preparation (down to LN2temperature) and air-isolated transfer and preparation environment. The recently upgraded configuration includes: Large specimen polishing –specimens up to 40mm in diameter can be prepared Controlled cooling environment –down to LN2temperature (8hr cooling retention) Controlled air isolated preparation and transfer of specimens for subsequent SEM observation Large area preparation –up to 8mm wide cross-sections Milling rate -up to 1.2 mm/hr * Accelerating voltage -up to 10kV * Intermittent milling –automated duty cycle for beam sensitive materials * IB-10500HMS Metallurgy Traditional mechanical preparation of metal surfaces suffers from various artifacts, such as scratches and embedded polishing media, that obscure the original microstructure and grain orientation information. Broad ion beam polishing using the JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts. CP is a tabletop instrument ideally suited for obtaining precise crystallographic information, including grain orientation, grain boundary and strain information. Battery Materials LIB composed of ceramics, metallic foils and polymers present a complex system that presents challenges for traditional mechanical specimen preparation techniques. Broad beam ion milling with JEOL CP polisher is a robust way to obtain pristine artifact-free cross sections and is the only reliable technique to get a clear sense of different layers as well as interfaces between layers. JEOL CP combines cryogenic and air-isolated environments to provide extreme versatility and resulting sample fidelity. Soft Materials Traditional mechanical preparation of polymer films and interfaces suffers from various artifacts that obscure the original microstructure. Broad ion beam polishing using JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts including the ability to cryogenically cool samples while ion milling. CP is a tabletop instrument ideally suited for obtaining precise cross-sections of various polymer blends and thin films. Composite Materials Traditional mechanical preparation of composite materials suffers from various artifacts due to differences in hardness and thermal expansion of individual constituents. Broad ion beam polishing using JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts; the instrument includes cryogenic capability for additional flexibility. CP is a tabletop instrument ideally suited for obtaining precise microstructural information, including grain orientation, material interface and strain information. Coatings & Paint Traditional mechanical preparation of coatings and paint layers suffers from various artifacts due to differences in hardness and thermal expansion of individual layers. Broad ion beam polishing using JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts; the instrument includes cryogenic capability for additional flexibility. CP is a tabletop instrument ideally suited for obtaining precise microstructural information, including layer thickness, grain orientation, material interface and strain information. Paper Traditional mechanical preparation of fragile and porous materials, such as paper suffers from various artifacts that obscure the original interfaces and microstructure. Broad ion beam polishing using JEOL cross-section polisher (CP) offers pristine surface preparation with minimal artifacts; the instrument includes cryogenic capability for additional flexibility. CP is a tabletop instrument ideally suited for obtaining precise information about filler distribution, layer thickness and overall microstructure of the most fragile specimens without the need for embedding. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. Pristine Sample Preparation Using Broad Ion Beam.pdf 2.96 MB Related Articles New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam (Paper Analysis) In 2006, we introduced a new specimen preparation apparatus, Cross-section Polisher (CP), which employs a broad argon ion beam to prepare cross-sections of specimens [1-2]. The principle of the CP is simple: a region of the specimen that is not covered by the masking plate is milled by an argon broad ion beam, as shown in Fig.1. The specimens with irregular shapes and rough surfaces that cannot be embedded prior to ion milling require additional care and consideration prior to ion-milling with CP. New Cross-Section Sample Preparation Method Applied to Microstructural and Chemical Investigation of Steel Coatings using FE-SEM Steel strips coated with Al-43.5Zn-1.5Si (Galvalume) alloy exhibit superior corrosion resistance as compared to Zn galvanized steel strips. The continuous hot-dip coating process used to produce such coatings entails a metallurgical reaction between the steel strip and Al-Zn-Si liquid alloy that leads to formation of an intermetallic compound layer at the steel-coating interface. Formability of the coated strip depends strongly on the morphology, dimensions (thickness) and chemical nature of this intermetallic layer. Proper characterization of the intermetallic layer structure and chemistry and the nucleation sites on the steel surface is therefore of paramount importance for the development of formable Galvalume coated steel strips. This requires preparation of artifact free cross-sectional samples. Such samples can be obtained using JEOL Cross-section Polisher (CP). Unlike mechanical sample preparation techniques that introduce significant amount of strain and possible artifacts due to preferential etching of various constituents, the CP uses a broad Ar beam and a rocking stage that minimize possible preferential etching and produces strain free cross-sections. In this paper, SEM images as well as chemical (EDS) data characterizing the interface layer between the steel strip and the Galvalume coating prepared using Cross-sectional Polisher are presented. Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM Scanning Electron Microscopes (SEMs) have been used for various applications, such as research and development and failure analysis. There are many cases where not only observation of a specimen surface – but also observation of a cross section – is important. Preparation of a cross section depends on the specimen structure, observation purpose, and materials. Various preparation methods are put into practice: cutting, mechanical polishing, microtome, and FIB (Focused Ion Beam) are the major methods. In this discussion, we evaluate a new cross section specimen preparation method using an argon ion beam (hereinafter called the Cross-section Polishing or CP method). We have found that this method is extremely useful for observation of layer structures, interfaces, and crystalline structures of metals, ceramics, and composites. Here, we introduce examples of applications to various types of specimens. High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer – Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit Ion Slicer (IS) is an instrument used to prepare TEM lamellas and SEM cross-sections by employing an Ar broad ion beam. The IS has been getting quite popular in TEM and SEM laboratories because of its ease of use and high quality results. However, it is difficult to mill low melting point materials by the Ar broad ion beam because of thermal damage during the milling. Therefore, we have developed a specimen cooling unit for the IS. This cooling unit keeps specimen at low temperature during the ion milling to avoid the thermal damage. We named this system Cryo Ion Slicer(CIS). Sample Coating for SEM Modern day Scanning Electron Microscopes (SEMs) are capable of imaging at ultralow voltages or low vacuum modes to handle even the most non-ideal sample types without the need for extensive sample preparation. Low voltage, with its inherent low beam penetration into the sample, allows us to examine fine surface morphology. The added advantage to low voltage imaging is the ability to look at nonconductive samples and minimize charging artifacts. Low vacuum, on the other hand, allows us to look at and analyze non-conductive and outgassing samples at higher voltages required for other analytical techniques such as X-ray Analysis (EDS/WDS), Cathodoluminescence (CL) or Electron Backscatter Diffraction (EBSD). Thus, we have the tools to analyze many sample types with minimal to no sample preparation. A question often asked is with the versatility of today’s SEMs, is there any reason to add a conductive coating when preparing samples for the SEM? And if I add a conductive coating, what do I coat it with? There are a lot of options. Argon ion slicing (ArIS): a new tool to prepare super large TEM thin films from Earth and planetary materials TEM foil preparation techniques commonly used in geology, material science and cosmochemistry are argon ion milling, ultramicrotomy and the Focused Ion Beam (FIB) technique. In this study we report on Argon Ion Slicing (ArIS), a new gentle preparation method which enables for the first time to prepare super large continuous and relatively smooth electron-transparent thin films (up to 50,000 µm2) suitable for TEM use. So far Argon Ion Slicing was mainly applied on mono- or bi-mineralic samples in material science. We applied and improved this promising new technique on several geo-materials including two meteorite samples to prove the viability of ArIS on complex (polycrystalline, polyphase, porous) natural samples. The successfully obtained continuous electron-transparent thin films comprise an area of 44,000 µm2 for Murchison (CM 2) and 30,000 µm2 for the Allende (CV 3) meteorite samples, respectively. ArIS is a low-energy broad-ion-beam shadowing technique and benefits from an additional protection device (a copper belt). The sample portion directly beneath the belt is protected from the ion beam. The beam "slices off" the protruding sample parts on both sides of the belt and creates a large elongated wedge. Since the developing thin film is located almost parallel to the beam propagation direction, it is almost unaffected from any irradiation damage and a phase dependent preferred thinning is not observed. Rough sample edges were smoothened with a Cross section polisher prior to ArIS treatment, which turned out to be a crucial step to produce super large electron-transparent thin films. Showing 0 Comment Comments are closed.