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PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT200
JSM-IT510
High-Res, Large-Chamber SEM
JSM-IT700HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-IT800
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2100Plus
CRYO ARM™ 200
JEM-ACE200F
300 kV
JEM-ARM300F2
CRYO ARM™ 300 II
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Carbon Coater
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
ROYALPROBE
ROYALPROBE HFX
Cryogenic Probes for NMR
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Delta NMR Software
CRAFT for Delta
NMR in pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Mass Spectrometers
AccuTOF DART
AccuTOF DART Technology
AccuTOF DART Ionization Mechanisms
AccuTOF Time-of-Flight Mass Analyzer
AccuTOF DART High-Resolution Accurate Mass
AccuTOF GC-Alpha
msFineAnalysis
AccuTOF GCxGC MS
AccuTOF LC-Express
GC/Single-Quadrupole Mass Spectrometer
NETZSCH And JEOL
msFineAnalysis iQ
GC/Triple-Quadrupole Mass Spectrometer
msFineAnalysis iQ
MALDI SpiralTOF TOF/TOF
MALDI Imaging SpiralTOF
MStation
Microprobe (EPMA) and Auger
JXA-iHP200F
JXA-iSP100
JAMP-9510F
Soft X-Ray Emission Spectrometers
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S XRF
Correlative Microscopy Solutions
Additive Manufacturing 3D Printer
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
BS-60050EBS Electron Beam Source
EB Source Power Supply
Plasma Source
Rotary Sensor
Scanning Electron Microscopes (SEM)
Benchtop
:
NeoScope™
HV/LV Tungsten/LaB6 SEMs
:
IT200
|
IT510
High-Res, Large-Chamber SEM
:
IT700HR
FE SEM
:
JSM-IT800
FE SEM: The New Generation Overview
Sample Preparation Tools
Cross Section Polisher
|
Vacuum Evaporator
|
Smart Coater
|
Carbon Coater
Microprobe (EPMA) and Auger
JXA-iHP200F
|
JXA-iSP100
|
JAMP-9510F
Additive Manufacturing
JAM-5200EBM 3D Printer
Transmission Electron Microscopes (TEM)
120 kV
:
JEM-1400Flash
200 kV
:
NEOARM
|
CRYO ARM™ 200
|
JEM-F200
|
JEM-ACE200F
|
JEM-2100Plus
|
Monochromated ARM200F
300 kV
:
JEM-ARM300F2
|
CRYO ARM™ 300
Analytical & Data Optimization
JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
Environmental Control Solutions
Focused Ion Beam
JIB-4700F
|
JIB-4000PLUS
Medical Equipment
Industrial Equipment
Mass Spectrometers
AccuTOF™ DART®
AccuTOF™ GC-Alpha
AccuTOF™ GCxGC MS
AccuTOF™ LC-Plus
GC/Single-Quadrupole Mass Spectrometer
GC/Triple-Quadrupole Mass Spectrometer
MALDI SpiralTOF™ TOF/TOF
MALDI Imaging SpiralTOF™
MStation
Elemental Analysis
Soft X-ray Emission Spectrometer
ElementEye JSX-1000S
Nuclear Magnetic Resonance
JNM-ECZL series FT NMR
Probes
Delta NMR Software
CRAFT for Delta
NMR in Pharma
qNMR
Magnets
Sample Changers
Electron Spin Resonance
JES-X330
|
JES-X320
|
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
APPLICATIONS
Application List
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology Solutions
Life Sciences
Materials Science
Nanotechnology
Neuroscience
Semiconductor
SEE MORE HERE
Application List By Product
SEM Applications
TEM Applications
FIB Applications
NMR Applications
Mass Spec Applications
Sample Preparation Applications
REALab Customer Stories
Yokogushi (Cross-Platform Analysis)
FINANCING
RESOURCES
Electron Optics
Documents & Downloads
Image Gallery
FAQs
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Videos
Analytical Instruments
Documents & Downloads
Image Gallery
Walkup NMR
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
No-D NMR
Non Uniform Sampling (NUS)
Mass Spectrometry Basics
NMR Basics
NMR Magnet Destruction
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
JEOL Webinars and Videos
JEOL Posters
JEOL Periodic Table App
JEOL MS Calculator App
SERVICE / SUPPORT
JEOL USA Service & Support
Request Service
Offered Services
Service Level Agreements
Instrument Training
SEM/TEM Training
NMR Training
Mass Spectrometry Training
Parts Center
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Request for Quotation
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NEWS & EVENTS
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JEOL in the News
Events & Shows
JEOL USA 2022 Image Contest Entries & Winners
NeoScope Image Contest
2021 Entries & Winners
2020 Entries & Winners
2019 Entries & Winners
2018 Entries & Winners
2017 Entries & Winners
2016 Entries & Winners
2015 Entries & Winners
2014 Entries & Winners
JEOL USA Image Contest Entry Form
JEOL USA Large Chamber SEM Image Contest Entry Form
JEOL NEWS Magazine
JEOL Newsletters
JEOLink Newsletter
Mass Media Newsletter
JEOLink NMR Newsletter
BLOG
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CONTACT US
JEOL USA Headquarters
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SERVICE / SUPPORT
/
Demand Service
TERMS & CONDITIONS - DEMAND SERVICE (Time & Materials)
A valid purchase order or credit card (Mastercard® or Visa®), in advance, is required for all Demand Service.
Demand Service rates are per the current published price list.
A "Daily Minimum" (8 hours) applies to all requested Demand Service of less than three (3) days. A "half-day minimum" may be used if the engineer is able to be scheduled for the remaining hours in the work day.
Payment terms for Demand Service are Net 30.
Response time is on an "as available" basis. Critical response is available, upon request, through our National Staff. All related expenses, such as airfare, car rental, travel time (portal to portal), per diem, will be assessed.
Demand Service Warranty = 30 Days Labor, 90 Days Parts. This warranty only applies to the system assemblies repaired by JEOL. JEOL reserves the right to determine whether any instrument failure during the 30/90 day warranty is related to any previous service work performed.
Parts replacement costs will be the responsibility of the customer. Any part determined to be defective will be repaired or replaced per JEOL’s standard business practices.
JEOL business hours are 8:30AM to 5:00PM, Monday through Friday. Off-Hour Service will be charged at 1.5 X Current Rate. Scheduling is restricted and may require Regional/National Manager’s approval.
JEOL service engineers are authorized to service JEOL equipment ONLY. If, during the course of the service visit, it becomes necessary to remove another vendor’s hardware from the JEOL instrument, it is recommended that you enlist the services of that vendor or have it removed by internal personnel. Should the customer request that the JEOL service engineer assist with the removal of another vendor’s hardware, JEOL will not be liable for any damages incurred on the equipment.
In no event shall JEOL be liable, by reason of any cause, for prospective, consequential or special damages, economic loss or damages resulting from the loss of use of JEOL’s products.
All past due balances shall be subject to a service charge of ONE and ONE-HALF PERCENT (1½%) PER MONTH or EIGHTEEN PERCENT (18%) PER ANNUM or the maximum permitted by state law. JEOL reserves the right to withhold service from any customer with a past due account balance of 45 days or more.
JEOL will maintain insurance coverage as required. A certificate is available upon request. It is the customer’s responsibility to obtain insurance coverage when relocating an instrument.