The JEOL JSM-IT100 is the latest addition to the award-winning InTouchScope Series of Scanning Electron Microscopes. Representing 50 years of industry and technological leadership, the IT100 is a simple-to-use, versatile, research-grade SEM with a compact ergonomic design.
Now with expanded EDS analysis capabilities, the InTouchScope is a versatile workhorse SEM that can be configured to meet individual lab requirements at an exceptional value. It offers high resolution imaging and a range of acceleration voltages at both high and low vacuum modes.
The IT100 is a remarkably intuitive, high throughput microscope designed to streamline workflow in any lab. Touchscreen operation, or traditional keyboard and mouse interface are at the operator's fingertips. Fast data acquisition make imaging and analysis of samples a simple task.
With the IT100, it is simple to quickly obtain high quality images using both Secondary Electron and Backscatter Imaging. The embedded JEOL EDS system with silicon drift detector technology now includes Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation, Partial area, Line Scan, and Mapping Filter functions.
JEOL's popular InTouchScope series includes the NeoScope benchtop SEM with selectable HV/LV and the JSM-IT300LV with advanced analytical capabilities and imaging of large, intact samples.