p: (978) 535-5900     e: salesinfo@jeol.com

JEOL USA Scanning Electron Microscopes

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

JEOL innovations in resolution and functionality enable the microscopist to better image and characterize a new generation of nanomaterials, capture biological details, analyze forensic evidence in detail, direct write fine nanopatterns, and pinpoint elusive quality problems.

Tungsten SEMs

JSM-IT300LV InTouchScope
Versatile Research Grade SEM
JSM-IT100 InTouchScope
Versatile Research Grade SEM

Field Emission SEMs

Extreme Resolution All-in-One FE SEM
Extreme Resolution All-in-One FE SEM
Ultrahigh Resolution Analytical FE SEM
Analytical FE SEM for magnetic to neuroscience samples

Benchtop SEM

MultiBeam FIB/SEMs

Analytical Optimization

We offer a wide range of SEM models

JEOL USA has also developed many unique solutions for SEM applications including:

We offer tailored applications solutions in concert with our partners, including:

Additional Reading: