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JEOL NEWS Magazine

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JEOL NEWS Volume 51, Number 1, July, 2016

In this issue:

  • Atomic Resolution Microscopy of Intermetallic Clathrates
  • Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy
  • Microscopic Analyses of Deformation Structures around Fatigue Crack Tips
  • Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy
  • Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics
  • Visualization of Invisible Defects in Semiconductor Devices
  • Development of Cryo-Coil MAS Probe for Multinuclear Measurement
  • Development of JEM-F200(F2) Multi-Purpose Electron Microscope
  • Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM
  • Depth Profile Measurement with JPS-9030
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JEOL NEWS Magazine Archive Issues

 

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JEOL NEWS Volume 50, Number 1, July, 2015

In this issue:

  • Lorentz TEM Study on Magnetic Skyrmions and Their Dynamics
  • Quantitative ADF STEM for Catalyst Nanoparticle Metrology
  • Application of Atomic-Resolution Energy-Dispersive X-ray Spectroscopy to the Study of Structures of Decagonal Quasicrystals
  • Dressing Living Organisms in the NanoSuit® for FE-SEM Observation
  • Serial Block Face Scanning Electron Microscopy Using the JEOL JSM-7100F with Gatan 3View 2XP at King’s College London – UK
  • Detailed Structural Characterization of Polymers by MALDI-TOFMS with a Spiral Ion Trajectory
  • 13C and 1H Solid-state NMR of Proteins and Other Systems under Ultra-Fast MAS at 80-100 kHz and Beyond
  • Development of Super-High Sensitivity EDS System for GRAND ARM (JEM-ARM300F)
  • Newly Developed Soft X-ray Emission Spectrometer, SS-94000SXES
  • Additional Ar-Ion Etching of FIB-Prepared TEM Samples using Ion Slicer
  • New Gas Chromatography/ High Resolution Time-of-Flight Mass Spectrometer JMS-T200GC “AccuTOF GCx”
  • Introduction of JEOL Products

JEOL NEWS Volume 49, Number 1, September, 2014

In this issue:

  • Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
  • Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
  • Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
  • Photonic Crystal Lasers
  • Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
  • Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells
  • Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
  • Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
  • Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
  • Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
  • Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
  • New Series of NMR Spectrometers JNM-ECZ

JEOL NEWS Volume 48, Number 1, July, 2013

In this issue:

  • Innovation in Structural Interpretation of Al-TM (Transition-metal) Decagonal Quasicrystals By Cs-corrected STEM
  • Structural Analysis of Nanoparticles Using Scanning Transmission Electron Microscopy
  • Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
  • Effects of l-menthol on the Thermotropic Characteristics of Intercellular Lipid in the Hairless Rat Stratum Corneum Evaluated by Differential Scanning Calorimetry and Electron Spin Resonance
  • Introduction of New Products

JEOL NEWS Volume 47, Number 1, July, 2012

In this issue:

  • High Resolution Imaging and Spectroscopy Using CS-corrected TEM with Cold FEG JEM-ARM200F
  • Strain Measurement by Dark Field Electron Holography with Dual Lens Operation
  • Adapting a JEM-2100F for Magnetic Imaging by Lorentz TEM
  • A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy
  • Electron Microscopic Study and X-ray Probe Microanalysis of the Liver of LEC Rat, an Animal Model of Wilson Disease
  • Electron Microprobe Study of Otolith: Migratory Behavior and Habitat of Three Major Temperate Species of Eels
  • Realization of an Innovative Metrological Traceability Using the Quantitative NMR Method
  • Introduction of New Products

JEOL NEWS Volume 46, Number 1, July 2011

In this issue:

  • Study of Nanoparticles at UTSA: One Year of Using the First JEOL-ARM200F Installed in the USA
  • Exploring Biological Samples in 3D Beyond Classic Electron Tomography
  • Application of Scanning Electron Microscope to Dislocation Imaging in Steel
  • Atmospheric Scanning Electron Microscopy (ASEM) Realizes Direct EM-OM Linkage in Solution: Aqueous Immuno-Cytochemistry
  • Information Derived from PGSE-NMR - Ion Diffusion Behavior, Molecular Association, Molecular Weight / Composition Correlation of Synthetic Polymers
  • Development of JEM-2800 High Throughput Electron Microscope
  • Introduction of New Product JEM-2800 High Throughput Electron Microscope
  • Introduction of New Product JSM-7800F Thermal Field Emission Scanning Electron Microscope

JEOL NEWS Volume 45, Number 1, July 2010

In this issue:

  • Lithium Atom Microscopy at Sub-50pm Resolution by R005
  • Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM
  • Application of a Helium-Cooled Cryo-Electron Microscope for Single Particle Analysis
  • Ultrahigh-Resolution STEM Analysis of Complex Compounds
  • Development and Applications of a Frequency Modulation Atomic Force Microscopy for High-resolution Imaging in Liquids
  • JEM-2100: Applications in Nanotechnology
  • Development of JMS-S3000: MALDI-TOF/TOF Utilizing a Spiral Ion Trajectory
  • Rapid Characterization of Bacteria Using ClairScope™ and SpiralTOF™
  • Micro Area Analysis with JXA-8530F (FE-EPMA)
  • Analysis of Insulator Samples with AES

JEOL NEWS Volume 44, Number 1, June 2009 - JEOL 60th Anniversary Issue

In this issue:

JEOL 60th Anniversary Issue.

  • Congratulatory Message for the 60th Anniversary of JEOL
  • Congratulations from Arizona State University
  • Marking Our 60th Anniversary
  • Aiming for Best Total Solutions
  • Exit Wavefunction Reconstruction
  • Single Shot Nanosecond Imaging in the Dynamic TEM
  • An Appraisal of High Resolution Scanning Electron Microscopy Applied To Porous Materials
  • Observation of Membrane Proteins Through An Electron Beam
  • HR-TEM of Carbon Networks - Towards Individual C-C Bond Imaging
  • Studies on Natural Antioxidant Derivatives: Enhanced Radical-Scavenging and Reduced Prooxidant Activities
  • Development of Nanoimprint Mold Using JBX-9300FS
  • Introduction of New Products

JEOL NEWS Volume 43, Number 1, July 2008

In this issue:

  • Interface Studies by Cs-Corrected STEM
  • Field Emission AES Characterization of Corrosion Products Formed on Copper in Chloride Containing Solutions
  • Characterization of Coherent Precipitates in Mg-RE(-Zn) (RE: Gd, Y) Alloys by the Combination of HRTEM and HAADF-STEM
  • Quantitative Electron Microscopy Using Digital Data Processing
  • Case Study on Failure Analysis by Electron Beam Absorbed Current Method
  • Featured Article from Recipient of the Ernst Ruska Award 2007: Recent Advances in Transmission Electron Microtomography for Materials Research
  • Featured Article of Electron Spin Resonance (ESR) Spectroscopy: ESR Study of the Fundamentals of Radical Polymerizations Characteristic Features of JIB-4500 MultiBeam System
  • High Power Electron Beam Source Used for Melting Metal Materials
  • Introduction of New Products

JEOL NEWS Volume 42, Number 1, 2007

In this issue:

  • Characterization of the JEM-2100F-LM TEM for Electron Holography and Magnetic Imaging
  • Improvement of Reflection Electron Microscopy: LODREM
  • Where Are the Atoms in Quasicrystals? - direct imaging by aberration-corrected STEM
  • A New High-Temperature Multinuclear-Magnetic-Resonance Probe for Structure, Dynamics, and Reaction in Supercritical Water
  • High Utility of Electro- and Cold-Spray Ionization Time-of-Flight Mass Spectra in Development of Functional Metalloenzyme Models: Detection of Labile Metal Complexes and Reactive Intermediates
  • Failure Analysis of Cu/Low-k Interconnects Using Electron Beam Absorbed Current Images
  • New Development of DOSY-NMR – Application to Structure Elucidation of Unstable Intermediates
  • Auger Analyses Using Low Angle Incident Electrons
  • Examination of Analytical Conditions for Trace Elements Based on the Detection Limit of EPMA (WDS)
  • Introduction of New Products

JEOL NEWS Volume 41, Number 1, 2006

In this issue:

  • The Aberration corrected JEOL JEM-2200FS FEG-STEM/TEM Fitted with an Ω Electron Energy-Filter: Performance Characterization and Selected Applications
  • Applications of Aberration Corrected Transmission Electron Microscopy to Materials Science
  • Visualization of Biological Nano-Machines at Subnanometer Resolutions
  • Intracellular Transport and Kinesin Superfamily Proteins, KIFs: Genes, Structure, Dynamics, Functions and Diseases
  • Ultrahigh Pressure Earth Science: Applications of TEM and FIB Techniques for Study of Core-Mantle Boundary Region of Earth
  • Method of Automatic Characterization of Inclusion Population by a SEM-FEG/EDS/ Image Analysis System
  • Direct Observation of Biomolecular Complexes by Cold-Spray Ionization Time-of-Flight Mass
    Spectrometry
  • Methods of Evaluating Activity of Photocatalytic Materials Using Electron Spin Resonance (ESR) Spectroscopy

JEOL NEWS Volume 40, Number 1, 2005

In this issue:

  • Three-Dimensional Reconstruction of Biological Macromolecular Complexes Using Cryoelectron Microscopy on Frozen-Hydrated Samples
  • Direct Analysis in Real Time (DART™) Mass Spectrometry
  • High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects
  • Recent Development of TEM for Advanced Ceramics
  • Advanced Analysis Technology Supporting SiP
  • FT NMR New Technical Introduction
    • Introduction of Fully Automatic NMR Measurement Tool "GORIN" for Protein Solution
    • 100 Sample Auto Sample Changer and Tubeless NMR
    • Windows Delta 
    • Latest Information and Future for ALICE2 Software
  • Features and Applications of Newly-Developed GC-TOFMS "The AccuTOF GC"
  • Development of Ion Slicer (Thin-Film Specimen Preparation Equipment)
  • Introduction of Wafer Edge SEM Review

JEOL NEWS Volume 39, Number 2, 2004

In this issue:

  • TEM Study of Water in Carbon Nanotubes
  • A Study of Metal Nanowire Structures by High-Resolution Transmission Electron Microscopy
  • Introduction of JWS-2000 Review SEM
  • Grazing-Exit Electron Probe Microanalysis (GE-EPMA)
  • Fullerenes and Carbon Nanotubes: Nanocarbon Assuming a Leading Role in the 21st Century
  • Introduction of Products

JEOL NEWS Volume 39, Number 1, 2004

In this issue:

  • A Double Aberration Corrected, Energy Filtered HREM/STEM
  • Variable Magnification of Electron Holography for Junction Profiling of Semiconductor Devices with Dual Lens System on JEOL JEM-2010F
  • The Electron Backscatter Diffraction Technique – A Powerful Tool to Study Microstructures by SEM
  • Growth and Encystment of the Ciliate Tetrahymena sp. Found in a Dead Mosquito's Larva
  • ALCHEMI Studies on Quasicrystals
  • Electron Spin Resonance Spectroscopy in Food Radiation Research
  • Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM
  • Introduction of new products

JEOL NEWS Volume 38, Number 2, 2003

In this issue:

  • Atomic Resolved HAADF-STEM for Composition Analysis
  • Atomic Structure Analysis
  • Direct Imaging of a Local Thermal Vibration Anomaly Through In-situ High-temperature ADF-STEM
  • Cold-spray Ionization Mass Spectrometric Observation of Biomolecules in Solution
  • Electron Spin Resonance (ESR) in Nanocarbon Research
  • Analysis of Cadmium (Cd) in Plastic Using X-ray Fluorescence Spectroscopy
  • JWS-3000 High-Resolution Review SEM
  • Application and Extension of Pickup Method to Various Materials
  • Introduction of New Products

JEOL NEWS Volume 38, Number 1, 2003

In this issue:

  • Mapping of sp2/sp3 in DLC Thin Film by Signal Processed ESI series Energy Loss Image
  • Electron Holographic Analysis of Nanostructured Gold Catalyst
  • Single Atomic Column Observation in Silicon Boundary
  • The Scanning Electron Microscope as a Tool for Experimental Nanomechanics
  • Observation of Dislocation Structure of Fatigued Metallic Materials by Scanning Electron Microscopy
  • Protein NMR - Ability of the JNM-ECA series
  • Development of the JBX-3030MV Mask Making E-Beam Lithography System
  • Chromatic and Spherical Aberration Correction in the LSI Inspection Scanning Electron Microscope
  • Peak Deconvolution Analysis in Auger Electron Spectroscopy II
  • Applications of Micro-Area Analysis Used by JPS-9200 X-ray Photoelectron Spectrometer
  • Introduction of New Products

JEOL NEWS Volume 37, Number 1, 2002

In this issue:

  • A Cs Corrected HRTEM: Initial Applications in Materials Science
  • Quantitative Environmental Cell - Transmission Electron Microscopy: Studies of Microbial Cr(VI) and Fe(III) Reduction
  • Simulations of Kikuchi Patterns and Comparison with Experimental Patterns
  • Experimental Atomically Resolved HAADF-STEM Imaging - A Parametric Study
  • Observation of Waterborne Protozoan Oocysts Using a Low-Vacuum SEM
  • A Possible Efficient Assay: Low-Vacuum SEM Freeze Drying and Its Application for Assaying Bacillus thuringiensis Formulations Quality
  • Observations of Algae and Their Floc in Water Using Low-Vacuum SEM and EDS
  • Development of Nano-Analysis Electron Microscope JEM-2500SE
  • Development of JSM-7400F; New Secondary Electron Detection Systems Permit Observation of Non-Conductive Materials
  • Applications of Image Processing Technology in Electron Probe Microanalyzer
  • Technology of Measuring Contact Holes Using Electric Charge in a Specimen
  • Organic EL Display Production Systems - ELVESS Series
  • In-Situ Observation of Freeze Fractured Red Blood Cell with High-Vacuum Low-Temperature Atomic Force Microscope
  • Peak Deconvolution of Analysis in Auger Electron Spectroscopy
  • JEOL's Challenge to Nanotechnology
  • Progress in Development of High-Density Reactive Ion Plating
  • Applications of High-Power Built-in Plasma Gun
  • Introduction of New Products

JEOL NEWS Volume 35, Number 1, 2000

In this issue:

  • 100kV E-Beam Lithography System: JBX-9300FS
  • Gate Oxide Characterization using Annualr Dark Field Imaging
  • JEOL Intro of New Products
  • Kankan Diamonds (Guinea): probing the lower mantle

JEOL NEWS Volume 34, Number 1, 1999

In this issue:

  • A 1000kV TEM Running Over 25 Years
  • Atomic Resolution Z-Contrast Imaging of Interfaces and Defectst
  • The Growing Role of Electron Crystallography in Structural Biology
  • Factors Promoting R&D in Electron Microscopy in Japan
  • The Development and Assessment of a High Performance FE Gun Analytical HREM for Materials Science Applications
  • Immunogold-labeling in Scanning Electron Microscopy
  • Measure Contact Potential Difference Using an Ultrahigh Vacuum Noncontact Atomic Force Microscope
  • Microscopic Chemical State Analysis by FE-SAM with Hemispherical Energy Analyzer
  • Miniaturized STM Working Simultaneously in UHV Electron Microscope
  • High-Resolution Electron-Beam Lithography and Its Application toMOS Devices
  • Development of Optical Technology for JEOL's Electron Probe Instruments
  • Observation of Protein Structures through an Electron Beam
  • Transition of JEOL's Semiconductor Equipment, and Future Development
  • Applicatrion of Semi-in-Lens FESEM for Chargeless Observation
  • Development History of JEOL's Transmission Electron Microscopes
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