M&M 2025

PRODUCTS

• Scanning Electron Microscopes (SEM)
  • HV/LV Tungsten/LaB6 SEMs
  • JSM-IT210
  • JSM-IT510
  • High-Res, Large-Chamber SEM
  • JSM-IT710HR
  • Benchtop
  • NeoScope Benchtop SEM
  • FE SEM
  • JSM-IT810
  • SEM-FIB
  • Elemental Analysis
  • miXcroscopy™
  • SMILE VIEW™ Map software
  • Neo Comfort FE-SEM Acoustic Enclosure
• Transmission Electron Microscopes (TEM)
  • 120 kV
  • JEM-120i
  • 200 kV
  • NEOARM
  • Monochromated ARM200F
  • JEM-F200 F2
  • JEM-2100Plus
  • CRYO ARM™ 200
  • JEM-ACE200F
  • JEM-Z200MF
  • 300 kV
  • JEM-ARM300F2
  • CRYO ARM™ 300 II
  • Analytical & Data Optimization
  • JEOL-IDES Products
  • Environmental Control Solutions
  • SightSKY CMOS Camera
  • SiN Window Chip
  • Stack N Viz software
• Focused Ion Beam
  • CRYO-FIB-SEM
  • JIB-PS500i
  • Specimen Preparation System STEMPLING
• Sample Preparation Tools
  • Cross Section Polisher
  • Vacuum Evaporator
  • Smart Coater
  • Carbon Coater
  • UV Cleaner
  • Auto Fine Coater
  • Ion Cleaner
  • Dry Pumping Multi Station
  • HD Treatment
• Nuclear Magnetic Resonance
  • JNM-ECZL series FT NMR
  • Probes
  • ROYALPROBE
  • ROYALPROBE HFX
  • ROYALPROBE P+
  • Cryogenic Probes for NMR
  • Liquids/Solution State Probes
  • AutoMAS Solids Probe
  • HCN MAS and HXY NMR Probes
  • Solid State NMR Probes
  • NMR Probe Key Features and Applications
  • Delta NMR Software
  • CRAFT for Delta
  • NMR in pharma
  • qNMR
  • Magnets
  • Sample Changers
  • Cryogen Reclamation System
• Electron Spin Resonance
  • JES-X330
  • JES-X320
  • JES-X310
• Mass Spectrometers
  • AccuTOF DART
  • AccuTOF DART Technology
  • AccuTOF DART Ionization Mechanisms
  • AccuTOF Time-of-Flight Mass Analyzer
  • AccuTOF DART High-Resolution Accurate Mass
  • AccuTOF GC-Alpha
  • msFineAnalysis AI
  • AccuTOF GCxGC MS
  • AccuTOF LC-Express
  • GC/Single-Quadrupole Mass Spectrometer
  • NETZSCH And JEOL
  • msFineAnalysis iQ
  • GC/Triple-Quadrupole Mass Spectrometer
  • msFineAnalysis iQ
  • MALDI SpiralTOF TOF/TOF
  • msRepeatFinder Polymer Analysis Software
  • MALDI Imaging SpiralTOF
• Microprobe (EPMA) and Auger
  • JXA-iHP200F
  • JXA-iSP100
  • JAMP-9510F
  • Soft X-Ray Emission Spectrometers
• Photomask / Direct Write Lithography
  • Electron Beam Lithography
  • JBX-A9
  • JBX-8100FS
  • JBX-3050MV
• Elemental Analysis
  • Embedded EDS for SEM
  • Gather-X Windowless EDS
  • Soft X-ray Emission Spectrometer
  • ElementEye JSX-1000S XRF
• Correlative Microscopy Solutions
• Additive Manufacturing 3D Printer
• Medical Equipment
  • BioMajesty Series
  • JCA-6010/C
  • JCA-BM 6050
  • JCA-9130/C
  • JCA-BM 2250
  • JCA-BM 8000 Series
• Industrial Equipment
  • High-Power Electron Beam Sources
  • Electron Beam Sources
  • BS-60050EBS Electron Beam Source
  • EB Source Power Supply
  • Plasma Source
  • Rotary Sensor

APPLICATIONS

• Application List
  • Battery Materials
  • Ceramics
  • Chemistry
  • Energy
  • Failure Analysis
  • Food / Plant / Pesticides
  • Food
  • Forensics
  • Geology Solutions
  • Life Sciences
  • Materials Science
  • Nanotechnology
  • Pesticides
  • Plant
  • Plastics/Polymer
  • Semiconductor
  • SEE MORE HERE
• Application List By Product
  • SEM Applications
  • TEM Applications
  • NMR Applications
  • FIB Applications
  • Mass Spec Applications
  • Sample Prep Applications
• REALab Customer Stories
  • Center for Biologic Imaging at University of Pittsburgh
  • Lake Superior State University
• Yokogushi (Cross-Platform Analysis)

RESOURCES

• Electron Optics
  • Documents & Downloads
  • Image Gallery
  • FAQs
  • Links & Resources
  • Videos
  • Scanning Electron Microscopy Basics
• Analytical Instruments
  • Documents & Downloads
  • Walkup NMR
  • Reference Data
  • Tutorials (Mass Spec)
  • Tutorials (NMR)
  • No-D NMR
  • Non Uniform Sampling (NUS)
  • Mass Spectrometry Basics
  • NMR Basics
  • NMR Magnet Destruction
• Photomask / Direct Write Lithography
  • Documents & Downloads
• Sample Preparation
  • Documents & Downloads
  • Image Gallery
• Additive Manufacturing
• Webinars and Videos
• Posters
• JEOL Periodic Table App
• JEOL MS Calculator App
• Financing

SERVICE / SUPPORT

• JEOL USA Service & Support
  • Request Service
• Offered Services
  • Service Level Agreements
• Instrument Training
  • SEM/TEM Training
  • NMR Training
  • Mass Spectrometry Training
• Parts Center
  • Purchase
  • Request for Quotation
  • General Inquiry

NEWS & EVENTS

• Blog
• Press Releases
• Events & Shows
• JEOL USA Image Contest
  • 2025 Entries & Winners
  • 2024 Entries & Winners
  • 2023 Entries & Winners
  • 2022 Entries & Winners
  • 2021 Entries & Winners
  • 2020 Entries & Winners
  • 2019 Entries & Winners
  • 2018 Entries & Winners
  • 2017 Entries & Winners
  • 2016 Entries & Winners
  • 2015 Entries & Winners
  • 2014 Entries & Winners
  • NeoScope Image Contest
• Microscopy and Microanalysis 2025
• JEOL USA Image Contest Entry Form
• JEOL NEWS Magazine
• JEOL Newsletters
  • JEOLink Newsletter
  • Mass Media Newsletter
  • JEOLink NMR Newsletter

ABOUT US

• The Company
• Career Opportunities
  • Corporate Benefits
  • Current Career Opportunities
  • Submit Application
• Milestones
• Management Team
• FAQs

CONTACT US

• JEOL USA Headquarters
• JEOL Regional Web Sites
• Find a Local Sales Rep
  • Additive Manufacturing
  • EB Lithography (Direct Write)
  • Electron Microscopy
  • ESR, NMR, Mass Spectrometry
• Find a Local Service Office
  • Electron Microscopy / EB Lithography
  • ESR, NMR, Mass Spectrometry Instruments Service
• Request Product Info
• Directions to JEOL USA