Introducing the JEM-Z200MF: A Revolutionary Magnetic Field-Free Atomic Resolution Imaging System
JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen.
This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology.
Recently highlighted in a ...