JEOL USA Press Releases

JEOL USA Press Releases


JEOL USA Press Releases

April 10, 2007, Peabody, Mass. -- The acquisition of a new 300 kV field emission Transmission Electron Microscope (TEM) from JEOL distinguishes Indiana University, Bloomington, Indiana as a major United States research facility where scientists can examine both biological and materials science structures at nanoscale resolution. Acquisition of the new JEOL TEM was completed in February 2007 with an NSF Major Research Instrumentation Grant awarded in parallel with a $1M investment made by the University’s College of Arts and Sciences. The state-of-the art TEM will be housed in the University’s newly-constructed multidisciplinary science building, Simon Hall.

The JEOL TEM, a model JEM-3200FS, will be used for multiple disciplines by students and researchers in the fields of biology, chemistry, materials science, biochemistry, environmental and evolutionary sciences, geology, microbiology, and behavioral science, reflecting the University’s stated philosophy of achieving new vistas of understanding through interdisciplinary research.

Virus Studies Aid Development of Nanomaterials

Biologist and Assistant Professor Tuli Mukhopadhyay will use the TEM for cryo-electron microscopy and 3d image reconstructions on alphavirus particles, or virions, which have an external diameter of approximately 700 angstroms. Reconstructing the virions not only advances research in viruses transmitted by mosquitoes to a variety of hosts, it provides a model for nanotechnology in materials science.

Bogdan Dragnea, Professor of Chemistry and Adjunct Professor of Physics at IU, will use the TEM in nanoparticle research, mimicking virus self-assembly to developing self-assembled molecular layers and nanoparticles for materials science applications. Lyudmila Bronstein, Senior Scientist at the Department of Chemistry, will design nanoparticles for enhanced magnetic resonance imaging and virus studies in collaboration with Bogdan Dragnea’s group.

About the JEOL JEM-3200FS 300kV TEM

The JEM-3200FS offers excellent stability, high sample throughput, and ease of use. A Schottky field emission source provides ultra-high brightness, low energy spread and nanoprobe capabilities for unsurpassed spatial resolution. An in-column energy filter affords flexibility in recording high-resolution spectra on CCD cameras and film.

The cantilever microactive goniometer sample stage has five motorized axes. For automated grid scanning, tomography and routine operation, the fully computer controlled, eucentric goniometer provides low drift, high stability performance at ambient and cryotemperatures.

The newly designed energy filter is provided for acquiring energy-selected images and energy-loss spectra. Since this energy filter is a component lens of the image-formation lens system, a wide magnification range is available as in the conventional transmission electron microscope mode.

Indiana University will utilize the Sirius™ option which employs a hardwired connection to the Internet to allow remote operation of the TEM from other labs both within and outside the university environment. Additionally, wireless broadband capability can be installed to operate the microscope from non-traditional settings.

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