EM-09100IS Ion Slicer™

Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER

The Ion Slicer can prepare thin-film specimens without solvents or chemicals and requires no prior treatment of the specimen other than rectangular slicing (no disc grinding or dimple grinding).

The Ion Slicer prepares thin-film specimens faster and easier than conventional preparation tools. A low-energy, low-angle Ar ion beam irradiates the specimen while a thin shield belt allows low-angle irradiation of the Ar ion beam (from 0° to 6°), drastically reducing ion-beam irradiation damage to the specimen. The result is a high-quality thin film with few sputtering artifacts--even in soft materials. The Ion Slicer can efficiently prepare thin films from specimens having different compositions, even those having porous composites.

Key Features

  • High quality TEM pre-treatment
  • Fast preparation
  • No complicated pre-treatments
  • Minimal surface damage

Contact Us

  • Contact your local Sales Representative to schedule a virtual demo now
    (USA, Canada, Mexico, Brazil)

Request Ion Slicer
Product Info / Virtual Demo

Request Product Information

  • Product / Page of Inquiry: Ion Slicer

  • By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.