Image Alt Text

JSM-7200F All-in-One FE-SEM

The JSM-7200F is a highly versatile, easy-to-use analytical field emission SEM that offers a new level of expanded performance to the budget-conscious lab. This high resolution SEM is ideal for both imaging and analysis of nanostructures, and determining chemical composition of the sample through X-ray spectroscopy. By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-7200F dramatically increases analytical resolution to the sub 100nm scale. For analysis of non-conducting specimens, the JSM-7200F/LV is available with variable pressure.

From Magnetic to Neuroscience Samples

The JSM-7200F employs a newly designed hybrid conical objective lens that is a combination of electromagnetic and electrostatic lenses and a standard through-the-lens detector with energy filter allowing the selection of topography, Z contrast or a mix of the two. With no electromagnetic leakage below the lens, it is ideal for imaging magnetic samples and analyzing samples with EBSD.

For neuroscience applications, the JSM-7200F/LV with integrated Gatan 3View® Serial Block Face Imaging System creates perfectly aligned image stacks of thousands of sequentially-imaged slices of the freshly cut, resin embedded block face sample.

Versatile Performance

JEOL's proven beam deceleration mode (GB Mode) decreases charging on nonconductive specimens, improves spot size at low kV, and enhances surface topography. With the integration of in-the-lens acceleration and deceleration of the electron beam, low kV aberrations are reduced, yielding higher resolution at the lowest accelerating voltages. The ultra low voltage capability is suited for non-conductive samples and for enhanced high resolution imaging of nanostructures and specimen surface details. 

The JSM-7200F is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, EBSD, WDS, STEM, BSE, and CL. The system can also be equipped with a variety of sub stages including tensile, heating and cooling stages for in situ experimentation. 

JEOL Scanning Electron Microscopes

Technical Docs

Related Products

Cross Section Polisher

JSM-7200F Details

  • In-lens Schottky field emission gun maintains long-term beam stability for analysis as well as high beam current, high resolution, and low kV high resolution imaging.
  • Through-the-lens detector with energy filter standard.
  • An aberration correction lens (ACL) automatically optimizes both small probe current spot size for high resolution imaging and spot shape for high beam current, high resolution microanalysis.
  • A beam deceleration mode curtails charging on nonconductive specimens such as ceramics, semiconductors and polymers.
  • The objective lens forms no magnetic field around the sample, so magnetic samples can be analyzed without restriction.

The 7200F/LV has variable pressure capability which supports operation at low chamber vacuum (from 10 to 300 Pa) for the purpose of imaging and microanalysis of non-conductive samples. The configuration includes a retractable solid state backscattered electron detector. Via software control, both backscatter detector and LV orifice can be retracted without breaking chamber vacuum. This is a JEOL exclusive feature that guarantees unrestricted low magnification imaging and the ability to deliver maximum beam currents in HV operation. 

Low vacuum mode pressure 10 Pa ~ 300 Pa
Orifice and BSE detector
LV BEI standard, LV SED option
Retractable in vacuum

These documents are available by request.

Applications Notes

  • A Note on Magnification
  • Aperture Angle Control Lens
  • Energy Filtered Images
  • Extreme Low Voltage Imaging with JEOL Field Emission
  • Gentle Beam – Improving Low Voltage with Field Emission SEM
  • Low Vacuum Secondary Electron Detector
  • Resolution in SEM with Nanopix
  • STEM-in-SEM
  • Through-the-Lens System – New Approach for Reduction of the Effects of Lens Aberrations
  • Air Isolated Transfer System
  • Electron Flight Simulator
  • Electron Mirror – when sample charging is your friend
  • Low cost STEM
  • Poor Man’s CryoSEM
  • Short WD, Low kV BSE
  • Stereomicroscopy – search for the 3rd dimension
  • Why Use CryoTransfer System for SEM
  • Imaging Graphene

Articles and Papers

  • EBSD Analysis of Materials Utilizing High Temperature Protochips Aduro System in FE-SEM
  • Failure Analysis: the Old and the New
  • SEM Technology Advances Energy Research
  • Shedding New Light on Cathodoluminescence – an LV Perspective
  • Some Thoughts on Low kV Imaging 

These documents are available by request.