The JSM-F100 is a highly versatile, easy-to-use field emission SEM that offers the next level of analytical intelligence in FE-SEM for high spatial resolution imaging and analysis at nanoscale.
With one-click integration of optical imaging, SEM imaging, and EDS Live Analysis the F100 dramatically improves throughput. The new NeoEngine electron beam control system and advanced autofunctions provide fast transitions between high resolution imaging and high current analyses, without sacrificing performance. Live EDS analysis allows direct monitoring of specimen chemical composition during imaging; furthermore, the user can collect both EDS data (mapping, linescan or point analysis) and images within the F100 user interface.
For fast and simple report generation, JEOL’s SmileView Lab automatically links imaging and analysis results.
High Spatial Resolution
By combining large beam currents with a small probe size at ANY accelerating voltage, the JEOL JSM-F100 dramatically increases analytical resolution to the nanometer scale. It is an ideal platform for imaging and analysis of non-conductive samples and for enhanced high resolution imaging of nanostructures, specimen surface details, biological specimens, and magnetic samples.
The JSM-F100/LV is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, STEM, BSE, and CL. A new Soft X-ray Emission Spectrometer allows efficient and parallel collection of very low-energy X-rays whileproviding unprecedented chemical state analysis.