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JEOL USA, Inc.
 
  • PRODUCTS
    • Scanning Electron Microscopes (SEM)
      • HV/LV Tungsten/LaB6 SEMs
        • JSM-IT200
        • JSM-IT510
      • High-Res, Large-Chamber SEM
        • JSM-IT700HR
      • Benchtop
        • NeoScope Benchtop SEM
      • FE SEM
        • JSM-IT800
      • SEM-FIB
        • JIB-4700F / MultiBeam
        • JIB-4000 / MultiBeam
      • Soft X-ray Emission Spectrometer
    • Transmission Electron Microscopes (TEM)
      • 120 kV
        • JEM-1400Flash
      • 200 kV
        • NEOARM
        • Monochromated ARM200F
        • JEM-F200 F2
        • JEM-2100Plus
        • CRYO ARM™ 200
        • JEM-ACE200F
      • 300 kV
        • JEM-ARM300F2
        • CRYO ARM™ 300 II
      • Analytical & Data Optimization
      • JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
      • Environmental Control Solutions
    • Focused Ion Beam
      • JIB-4700F
      • JIB-4000PLUS
    • Sample Preparation Tools
      • Cross Section Polisher
      • Vacuum Evaporator
      • Smart Coater
      • Carbon Coater
    • Nuclear Magnetic Resonance
      • JNM-ECZL series FT NMR
      • Probes
        • ROYALPROBE
        • ROYALPROBE HFX
        • Cryogenic Probes for NMR
        • Liquids/Solution State Probes
        • AutoMAS Solids Probe
        • HCN MAS and HXY NMR Probes
        • Solid State NMR Probes
        • NMR Probe Key Features and Applications
      • Delta NMR Software
      • CRAFT for Delta
      • NMR in pharma
      • qNMR
      • Magnets
      • Sample Changers
    • Electron Spin Resonance
      • JES-X330
      • JES-X320
      • JES-X310
    • Mass Spectrometers
      • AccuTOF DART
        • AccuTOF DART Technology
        • AccuTOF DART Ionization Mechanisms
        • AccuTOF Time-of-Flight Mass Analyzer
        • AccuTOF DART High-Resolution Accurate Mass
      • AccuTOF GC-Alpha
        • msFineAnalysis
      • AccuTOF GCxGC MS
      • AccuTOF LC-Express
      • GC/Single-Quadrupole Mass Spectrometer
        • NETZSCH And JEOL
        • msFineAnalysis iQ
      • GC/Triple-Quadrupole Mass Spectrometer
        • msFineAnalysis iQ
      • MALDI SpiralTOF TOF/TOF
      • MALDI Imaging SpiralTOF
      • MStation
    • Microprobe (EPMA) and Auger
      • JXA-iHP200F
      • JXA-iSP100
      • JAMP-9510F
      • Soft X-Ray Emission Spectrometers
    • Photomask / Direct Write Lithography
      • Electron Beam Lithography
        • JBX-9500FS
        • JBX-8100FS
        • JBX-3050MV
    • Elemental Analysis
      • Soft X-ray Emission Spectrometer
      • ElementEye JSX-1000S XRF
    • Correlative Microscopy Solutions
    • Additive Manufacturing 3D Printer
    • Medical Equipment
      • BioMajesty Series
      • JCA-6010/C
      • JCA-BM 6050
      • JCA-9130/C
      • JCA-BM 2250
      • JCA-BM 8000 Series
    • Industrial Equipment
      • High-Power Electron Beam Sources
      • Electron Beam Sources
        • BS-60050EBS Electron Beam Source
      • EB Source Power Supply
      • Plasma Source
      • Rotary Sensor
    Scanning Electron Microscopes (SEM)
    Benchtop: NeoScope™
    HV/LV Tungsten/LaB6 SEMs: IT200 | IT510
    High-Res, Large-Chamber SEM: IT700HR
    FE SEM: JSM-IT800
    FE SEM: The New Generation Overview
    Sample Preparation Tools
    Cross Section Polisher | Vacuum Evaporator | Smart Coater | Carbon Coater
    Microprobe (EPMA) and Auger
    JXA-iHP200F | JXA-iSP100 | JAMP-9510F
    Additive Manufacturing
    JAM-5200EBM 3D Printer
    Transmission Electron Microscopes (TEM)
    120 kV: JEM-1400Flash
    200 kV: NEOARM | CRYO ARM™ 200 | JEM-F200 | JEM-ACE200F | JEM-2100Plus | Monochromated ARM200F
    300 kV: JEM-ARM300F2 | CRYO ARM™ 300
    Analytical & Data Optimization
    JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM
    Environmental Control Solutions
    Focused Ion Beam
    JIB-4700F | JIB-4000PLUS
    Medical Equipment
    Industrial Equipment
    Mass Spectrometers
    AccuTOF™ DART®
    AccuTOF™ GC-Alpha
    AccuTOF™ GCxGC MS
    AccuTOF™ LC-Plus
    GC/Single-Quadrupole Mass Spectrometer
    GC/Triple-Quadrupole Mass Spectrometer
    MALDI SpiralTOF™ TOF/TOF
    MALDI Imaging SpiralTOF™
    MStation
    Elemental Analysis
    Soft X-ray Emission Spectrometer
    ElementEye JSX-1000S
    Nuclear Magnetic Resonance
    JNM-ECZL series FT NMR
    Probes
    Delta NMR Software
    CRAFT for Delta
    NMR in Pharma
    qNMR
    Magnets
    Sample Changers
    Electron Spin Resonance
    JES-X330 | JES-X320 | JES-X310
    Photomask / Direct Write Lithography
    Electron Beam Lithography
  • APPLICATIONS
    • Application List
      • Ceramics
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      • SEE MORE HERE
    • Application List By Product
      • SEM Applications
      • TEM Applications
      • FIB Applications
      • NMR Applications
      • Mass Spec Applications
      • Sample Preparation Applications
    • REALab Customer Stories
    • Yokogushi (Cross-Platform Analysis)
  • FINANCING
  • RESOURCES
    • Electron Optics
      • Documents & Downloads
      • Image Gallery
      • FAQs
      • Links & Resources
      • Videos
    • Analytical Instruments
      • Documents & Downloads
      • Image Gallery
      • Walkup NMR
      • Reference Data
      • Tutorials (Mass Spec)
      • Tutorials (NMR)
      • No-D NMR
      • Non Uniform Sampling (NUS)
      • Mass Spectrometry Basics
      • NMR Basics
      • NMR Magnet Destruction
    • Photomask / Direct Write Lithography
      • Documents & Downloads
    • Sample Preparation
      • Documents & Downloads
      • Image Gallery
    • JEOL Webinars and Videos
    • JEOL Posters
    • JEOL Periodic Table App
    • JEOL MS Calculator App
  • SERVICE / SUPPORT
    • JEOL USA Service & Support
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    • Offered Services
      • Service Level Agreements
    • Instrument Training
      • SEM/TEM Training
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    • Parts Center
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      • General Inquiry
  • NEWS & EVENTS
    • What's New
    • Press Releases
    • JEOL in the News
    • Events & Shows
    • JEOL USA 2022 Image Contest Entries & Winners
      • NeoScope Image Contest
      • 2021 Entries & Winners
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      • 2016 Entries & Winners
      • 2015 Entries & Winners
      • 2014 Entries & Winners
    • JEOL USA Image Contest Entry Form
    • JEOL USA Large Chamber SEM Image Contest Entry Form
    • JEOL NEWS Magazine
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      • JEOLink Newsletter
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  • BLOG
  • ABOUT US
    • The Company
    • Career Opportunities
      • Working at JEOL
      • Corporate Benefits
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      • Submit Application
    • History of JEOL
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    • Management Team
    • FAQs
  • CONTACT US
    • JEOL USA Headquarters
    • JEOL Regional Web Sites
    • Find a Local Sales Rep
      • Electron Microscopy
      • ESR, NMR, Mass Spectrometry
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    • Find a Local Service Office
      • Electron Microscopy / EB Lithography
      • ESR, NMR, Mass Spectrometry Instruments Service
    • Request Product Info
    • Directions to JEOL USA
  • PRODUCTS / Scanning Electron Microscopes (SEM) / HV/LV Tungsten/LaB6 SEMs
  • Contact your local Sales Representative to schedule a
    virtual demo now (USA, Canada, Mexico, Brazil)
  • Find your local Service Office
  • Need Training on your instrument?
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