Facebook Icon
Instagram Icon
Linkedin Icon
Twitter Icon
Youtube Icon
Register
Login
HOME
JEOL Regional Web Sites
PRODUCTS
Scanning Electron Microscopes (SEM)
HV/LV Tungsten/LaB6 SEMs
JSM-IT500
JSM-IT200
High-Res, Large-Chamber SEM
JSM-IT500HR
Benchtop
NeoScope Benchtop SEM
FE SEM
JSM-7900F
JSM-7610FPlus
JSM-7200F
SEM-FIB
JIB-4700F / MultiBeam
JIB-4000 / MultiBeam
Soft X-ray Emission Spectrometer
Transmission Electron Microscopes (TEM)
120 kV
JEM-1400Flash
200 kV
NEOARM
Monochromated ARM200F
JEM-F200 F2
JEM-2800
JEM-2200FS
JEM-2100Plus
CRYO ARM™ 200
300 kV
JEM-ARM300F
CRYO ARM™ 300
Analytical & Data Optimization
Large Angle SDD-EDS
Thin Film Phase Plate Technology
JEM-2200FS
Tomography Solution
SerialEM Tomography Software
IMOD Tomography Software
Chimera Visualization Software
TEMography™
Automated Data Acquisition (JADAS)
Practical Remote In Situ Microscopy (PRISM)
Environmental Control Solutions
Microprobe (EPMA) and Auger
JAMP-9510F
JXA-8530FPlus
JXA-8230
Soft X-Ray Emission Spectrometer
Sample Preparation Tools
Cross Section Polisher
Vacuum Evaporator
Smart Coater
Mass Spectrometers
MALDI Imaging SpiralTOF
MALDI SpiralTOF TOF/TOF
InfiTOF
AccuTOF DART
AccuTOF GCx-plus
AccuTOF LP
MStation
Nuclear Magnetic Resonance
JNM-ECZS
JNM-ECZR
Delta NMR Software
CRAFT for Delta
Walkup NMR
Probes
ROYAL Probe
ROYAL HFX Probe
Liquids/Solution State Probes
AutoMAS Solids Probe
HCN MAS and HXY NMR Probes
Solid State NMR Probes
NMR Probe Key Features and Applications
Magnets
Sample Changers
NMR in pharma
Electron Spin Resonance
JES-X330
JES-X320
JES-X310
Photomask / Direct Write Lithography
Electron Beam Lithography
JBX-9500FS
JBX-8100FS
JBX-3050MV
Focused Ion Beam
JIB-4700F
JIB-4000PLUS
Medical Equipment
BioMajesty Series
JCA-6010/C
JCA-BM 6050
JCA-9130/C
JCA-BM 2250
JCA-BM 8000 Series
Industrial Equipment
High-Power Electron Beam Sources
Electron Beam Sources
EB Source Power Supply
Plasma Source
Electron Beam Source
Rotary Sensor
Elemental Analysis
ElementEye JSX-1000S
Soft X-ray Emission Spectrometer
Correlative Microscopy Solutions
APPLICATIONS
REALab
Ceramics
Chemistry
Energy
Failure Analysis
Forensics
Geology
Graphene SEM
Life Sciences
Materials Science
Nanotechnology
Neuroscience
Semiconductor
Yokogushi (Cross-Platform Analysis)
RESOURCES
Electron Optics
Documents & Downloads
FAQs
Image Gallery
Links & Resources
Mixed Media
Analytical Instruments
Documents & Downloads
Image Gallery
NMR Magnet Destruction
Reference Data
Tutorials (Mass Spec)
Tutorials (NMR)
Photomask / Direct Write Lithography
Documents & Downloads
Sample Preparation
Documents & Downloads
Image Gallery
Mixed Media
SERVICE / SUPPORT
JEOL USA Service & Support
Field Service
JEOL Instrument Training
SEM/TEM Training
MS Training
NMR Training
Parts Center
Purchase
Request for Quotation
General Inquiry
NEWS & EVENTS
What's New
JEOL in the News
Press Releases
Events & Shows
JEOL NEWS Magazine
JEOL Newsletters
JEOLink
Mass Media
Posters & Calendars
BLOG
ABOUT US
The Company
Career Opportunities
Working at JEOL
Corporate Benefits
Current Career Opportunities
Submit Application
FAQs
Milestones
Management Team
Demo Facilities
CONTACT US
JEOL USA Headquarters
Find a Local Sales Rep
Electron Microscopy
ESR, NMR, Mass Spectrometry
EB Lithography (Direct Write)
Find a Local Service Office
Electron Microscopy / EB Lithography
ESR, NMR, Mass Spectrometry Instruments Service
Request Product Info
Directions to JEOL USA
Search Button
Button
Delta™ NMR - CH Correlation Tutorial