Precise SEM Cross Section Polishing via Argon Beam Milling October 20, 2020 Operation of CP, Sample Preparation 0 A new precision argon ion beam cross section polisher simplifies the preparation of samples and makes it possible to prepare truly representative cross sections of samples free of artifacts and distortion. Use of the broad argon ion beam eliminates the problems associated with conventional polishing and allows for larger specimens to be prepared with precision. For full details: Attached files often contain the full content of the item you are viewing. Be sure and view any attachments. MicroToday CP Article MayJune06 FINAL.pdf 3.65 MB Showing 0 Comment Comments are closed.