JEOL USA Announces Grand Prize winners for 2015 SEM & TEM Image Contest
(January 14, 2016 -- Peabody, MA) -- JEOL USA selected two Grand Prize winners from a large collection of customer images submitted to the 2015 Image Contest throughout the calendar year. While one image was selected to win each month, the Grand Prize images exhibited the very best composition and resolution, and demonstrated excellent technical skills with Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).
The Grand Prize TEM image was awarded to Prof. ...