JEOL USA Press Releases

Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images (secondary electron, backscattered electron, and digital camera), on-screen measurement, and smart settings for simplified functionality. Secondary electron resolution is 3.0nm ...

Peabody, Mass., February 9, 2006 – Since capturing the Editor’s Gold Award for best new product at Pittcon 2005, the DART™ direct analysis ion source has found some unusual applications that, prior to this new technology, would have been virtually impossible. For example, fingerprints contain a great deal of chemical information that is not often exploited for forensic analysis. DART can detect and identify the chemical components of fingerprints, often providing information about specific substances ...