JEOL USA Press Releases

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

February 18, 2010 (Peabody, Mass.) -- The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas at San Antonio in January, and by early February began producing outstanding imaging results. “Achieving raw HAADF images showing at least 78 picometer information transfer in just three weeks demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to ...

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina

February 8, 2010, Peabody, Mass. -- The installation of an advanced imaging tool, a JEOL Electron Probe Microanalyzer (EPMA), will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina. In January, JEOL completed the installation of its new generation of EPMA, also known as a microprobe, at the Southeastern North Carolina Regional Microanalytical and Imaging Center (SENCR-MIC), a state-of-the-art facility opened in 2009 as a joint collaboration between Fayetteville ...
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