JEOL USA Press Releases

JEOL Introduces New Environmental Control System for Scientific Instrument Labs

June 30, 2011 (Peabody, MA) -- Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting the room, and the enclosed facility itself can all affect the performance of sensitive instrumentation. To help ensure optimum instrument performance and maintain a consistently cool environment without adding air turbulence, JEOL, a global supplier of ultrahigh resolution electron microscopes, has developed a ...

JEOL InTouchScope Scanning Electron Microscope Wins R&D 100 Award

June 30, 2011 (Peabody, MA) -- The JEOL InTouchScope™ SEM, a touchscreen-controlled analytical, portable low vacuum Scanning Electron Microscope, has been recognized by the editors of R&D Magazine as one of the 100 most technologically significant products introduced into the marketplace over the past year. “This is a significant honor for JEOL because the InTouchScope is the first SEM to combine the convenience of multi-touch screen operation, analytical versatility, and ease of use in a ...
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