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  PRODUCTS : Electron Optics : Scanning Electron Microscopes (SEM) : FE SEM  
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JEOL FE SEMs

Ultra Versatility - Sub-Nanometer Resolution - Choice of Capabilities

JEOL is proud to introduce a new series of Field Emission Scanning Electron Microscopes with ultrahigh resolution and outstanding low kV/low vacuum performance for imaging and nano analysis of structures, surface details, and magnetic samples. From the budget-conscious lab to leading edge research center, JEOL offers superior price/performance in the new 7000 series SEMs.

7000 Series FE SEM Lineup

Entry Level All-in-one FE SEM

JSM-7100F
HV
LV option
 
  • High resolution FE-SEM plus analytical capability for the budget-conscious lab
  • Double condenser lens and aperture control lens (ACL) designs provide high stable current and great analytical performance
  • Any type of sample, LV option
JSM-7100FT
HV
LV option
through the lens system
  • Higher resolution FE-SEM
  • In-column detectors with energy filter & beam deceleration
  • Double condenser lens and aperture control lens (ACL) designs provide high stable current and great analytical performance
  • Any type of sample, LV option

Ultrahigh Resolution Cold Cathode FE SEM

JSM-7500F
HV
 
semi in-lens
  • In-lens resolution performance for up to 200mm diameter samples
  • LABe low angle backscatter imaging for surface detail and compositional contrast
  • Integrated aperture control lens (ACL)
  • In-column detectors with energy filter & beam deceleration
  • Small Cc for superior low kV resolution

Ultrahigh Resolution Analytical FE SEM

JSM-7610F
HV
 
semi in-lens
  • Outstanding high resolution low kV specification
  • JEOL uniquely designed LABe detector
  • Double condenser lens and aperture control lens (ACL) designs provide high stable current and great analytical performance
  • Built-in energy filter & beam deceleration

Extreme Resolution All-in-one FE SEM

JSM-7800F
HV
LV option
through the lens system
super hybrid lens
  • Extreme high-resolution at all kVs
  • Any type of sample, LV option 
  • In-column detectors with energy filter & beam deceleration at all kVs
  • Double condenser lens and ACL designs provide high stable current and great analytical performance

 
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