This CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for frozen specimens, making it possible to prepare TEM specimens such as biopolymers.
The specimen transfer mechanism has a built-in sputter coating function. Therefore, this CRYO-FIB-SEM system alone can perform a series of processes to create TEM specimens from frozen specimens including conductivity coating, protective film forming, and FIB processing.
In addition, by using JEOL's CRYO ARM™ cartridge, direct specimen transfer to the CRYO ARM™ after TEM specimen preparation becomes easier.
After attaching a specimen mesh to the cartridge, it is no longer necessary to handle the specimen mesh using tweezers, so high-throughput specimen transfer can be performed.
The thermal conductivity cooling stage reduces stage drift and vibration caused by the cooling process and realizes steady TEM specimen preparation.
With this newly developed anti-contamination device, ice contamination in the specimen chamber is reduced. Even during prolonged preparation of large specimen amounts, the device suppresses ice contamination to the fullest extent.
A cryo-CLEM workflow using the CRYO ARM™ cartridge can be constructed using a cryostage manufactured by Linkam Scientific Instruments* and a fluorescence microscope manufactured by Nikon Solutions*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments.
By completing and submitting this form, you agree to the JEOL USA, Inc. Privacy Policy, and that your information may be shared with JEOL USA, Inc. and other JEOL affiliates.