- Highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
Available Models
| |
Resolution |
Accelerating
Voltage |
Magnification |
Stage |
| JSM-6701F |
1.0nm
2.2nm (1kV) |
0.5 to 30 kV |
x25 to 650,000
(printed as a 120mm x 90mm micrograph) |
Type I
X=70mm,
Y=50mm
Type II
X=110mm,
Y=80mm
Type III
X=140mm,
Y=80mm
|
| JSM-7500F |
1.0nm (15kV)
1.4nm (1kV)
0.6nm (30kV) attainable |
0.1 to 30 kV |
x25 to 1,000,000
(printed as a 120mm x 90mm micrograph) |
Type I
X=70mm,
Y=50mm
Type II
X=110mm,
Y=80mm
Type III
X=140mm,
Y=80mm
|
| JSM-7600F |
1.0nm (15kV)
1.5nm (1kV)
0.6nm (30kV) attainable |
0.1 to 30 kV |
x25 to 1,000,000
(printed as a 120mm x 90mm micrograph) |
|