JEOL NEWS Magazine

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  • Submit this form to gain immediate access to the new issue of JEOL NEWS Magazine, featuring:

    • Atomically Resolved Electric Field and Charge Density Imaging via 4D STEM
    • Phase-Modulated S-RESPDOR at Ultra-Fast MAS to Measure Accurate 1H-14N Distances
    • Electrostatic Potential Imaging of Organic Materials using Differential Phase Contrast
      Scanning Transmission Electron Microscopy
    • Visualization of Biological Structures by Ultra High-Voltage Electron Cryo-Microscopy
    • Observation of Phase Objects using STEM - Differential Phase Contrast (DPC) Microscopy
    • Chemical State Analysis of Light Elements in Nuclear Fission and Fusion Reactor Materials by Soft X-ray Emission Spectroscopy in Electron Probe Microanalyzer
    • Practical Workflow of CLEM – Trace of climbing fiber in cerebellar cortex of mouse
    • Development of JEM-ARM300F2: an Aberration Corrected 300 kV Microscope Capable of Both Ultrahigh
      Spatial Resolution Imaging and Highly Sensitive Analysis over a Wide Range of Acceleration Voltage
    • Various Analyses of Fine Structures using Multipurpose High Throughput Analytical FE-SEM: JSM-IT800
    • Introduction of Newly Developed Electron Probe Micro Analyzers
    • High-Sensitivity, High-Throughput Analysis of Residual Pesticides in Foods by JMS-TQ4000GC
      Combined with Large-Volume Injection Technique and Fast-GC Method
    • Mass Spectrometry Imaging using the JMS-S3000 “SpiralTOFTM-plus” Matrix Assisted
      Laser Desorption Ionization Time-of-Flight Mass Spectrometer
    • Introduction of JEOL Products

JEOL NEWS Magazine (previous issues)

Vol. 49 No. 1, Sept. 2014

• Development of Aberration Corrected Differential Phase Contrast (DPC) STEM
• Atomic-Resolution Characterization Using the Aberration-Corrected JEOL JEM-ARM200CF at the University of Illinois – Chicago
• Quantitative Characterization of Magnetic Materials Based on Electron Magnetic Circular Dichroism with Nanometric Resolution Using the JEM-1000K RS Ultra-High Voltage STEM
• Photonic Crystal Lasers
• Electron Microprobe Study of the Yinxu (Anyang) Bronze of Academia Sinica Collection
• Elucidation of Deterioration Mechanism for Organic Solar Cells – Toward Highly Efficient Solar Cells; Super High Resolution Imaging with Atomic Resolution Electron Microscope of JEM-ARM300F
• Advanced Analysis of Active Materials in Li-Ion Battery by XPS and AES
• Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes
• Analysis of Organic Thin Films by the Laser Desorption/Ionization Method Using the JMS-S3000 “SpiralTOF”
• Ultra-Low-Temperature-Probes (UltraCOOL™ probe / SuperCOOL™ probe)
• New Series of NMR Spectrometers JNM-ECZ

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