JEOL NEWS Magazine

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    - Fast Pixelated Detectors: A New Era for STEM
    - Aberration-Corrected Scanning Transmission Electron Microscopy of La2CuO4-based Superconducting Interfaces at the Stuttgart Center for Electron Microscopy
    - Technical Development of Electron Cryomicroscopy and Contributions to Life Sciences
    - Electronic State Analysis by Monochromated STEM-EELS
    - Chemical State Analyses by Soft X-ray Emission Spectroscopy
    - X-ray, Electron and NMR Crystallography to Structural Determination of Small Organic Molecules
    - Structural Analysis of Semiconductor Devices by Using STEM/EDS Tomography
    - Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
    - Biomarker Analysis in Petroleum Samples Using GC×GC-HRTOFMS with an Ion Source Combining Electron Ionization (EI) and Photo Ionization (PI)
    - Development of the JBX-8100FS Electron Beam Lithography System

JEOL NEWS Magazine (previous issues)

Vol. 51 No. 1, July 2016

Atomic Resolution Microscopy of Intermetallic Clathrates; Probing the Atomic-Scale Structure of Electrode Materials for Rechargeable Batteries by Aberration-Corrected Scanning Transmission Electron Microscopy; Microscopic Analyses of Deformation Structures around Fatigue Crack Tips; Rapid Screening and Quantification of Synthetic Cannabinoids with DART-MS and NMR Spectroscopy; Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics; Visualization of Invisible Defects in Semiconductor Devices; Development of Cryo-Coil MAS Probe for Multinuclear Measurement; Development of JEM-F200(F2) Multi-Purpose Electron Microscope; Three-Dimensional Reconstruction of Biological Tissues by Serial Block Face-SEM; Depth Profile Measurement with JPS-9030;

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