JEOL USA Press Releases

Peabody, Mass., March 6, 2009 -- The new AccuTOF-GCv from JEOL features the highest sensitivity of any GC time-of-flight mass spectrometer commercially available. By combining rapid data acquisition speeds with high resolution and a high dynamic range, the AccuTOF-GCv delivers exact mass measurements for both qualitative and quantitative analysis. The new AccuTOF-GCv introduces several new software features including automatic ion source tuning, automatic drift calibration, automatic data file conversion and export. The Tuning Assistant function ...

Peabody, Mass., March 5, 2009 -- JEOL, renowned for its role in the development and manufacture of advanced electron microscopy and spectroscopy products since 1949, kicks off its 60th anniversary celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences. Pittcon, also celebrating its 60th anniversary, is known for being the exhibition where companies debut their latest products and technology. JEOL USA will introduce new microscopy and spectrometry instrumentation, as ...

JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science. The brochure includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM). Demonstrations at American Academy of Forensic ...

February3, 2009 (Peabody, Mass.) -- JEOL USA is pleased to offer the latest tomography solutions for transmission electron microscopy (TEM). Tomography, or three-dimensional (3D) reconstruction of multiple TEM images, has developed in the past decade as one of the more important applications in the field of life sciences and, more recently, in the field of materials science. Through its applications group, JEOL USA offers support for tomography comprised of three software packages: SerialEM and IMOD, ...

January 6, 2009 (Peabody, Mass.) -- JEOL USA will install the first e-beam direct-write-on-wafer lithography tool to support nanoscience research in the Pacific Northwest when the University of Washington takes delivery of a JEOL JBX-6300FS e-beam system. The system will be installed in the state-funded Washington Technology Center Microfabrication Lab. Funding for the tool acquisition was provided through a state-supported STAR researchers’ grant to Michael Hochberg, Assistant Professor of Electrical Engineering, and a matching ...

October 28, 2008 – Peabody, Massachusetts – Electron microscope leader JEOL USA hosted a special visit recently from renowned materials scientist Dr. Akihisa Inoue, President of Tohoku University in Sendai, Japan. Dr. Inoue’s research in a new class of bulk amorphous metals has made a major impact on subsequent research into new materials around the world. U.S. Honors Dr. Inoue with Two Awards Dr. Inoue has recently received distinction as one of only nine foreign associates ...

October 29, 2008 – Peabody, Mass. - First it was pets, now it is babies who have died from ingesting food tainted with melamine. Detection of this chemical compound, which is being maliciously added to food products to make them appear to contain higher levels of protein, takes on a new urgency in a global market. A rapid screening technique that has been widely used for instant analysis without sample preparation has just been proven ...

Peabody, Mass., October 15, 2008 – Two of JEOL’s top-of-the-line cryo-electron microscopes will be key instrumentation for multi-disciplinary scientific advances in a new $1 billion research center in Kannapolis, North Carolina. The David H. Murdock Research Institute (DHMRI) has selected JEOL’s high resolution electron microscopes for its world-class laboratory, which will serve as a central resource to multiple university research institutes and private companies. The vision and impetus behind this collaborative research institute is that ...

“Shaping the technology of tomorrow” is the maxim of the College of Engineering at the University of Texas San Antonio, but shaping the scientists and engineers of the future is the mission of the college’s interactive Technology Experience Center (iTEC). A unique learning center that integrates technology with fun to captivate the interest of young children, iTEC is holding a series of open houses this fall for students ranging from kindergarten to high school age. ...

July 30, 2008 (Peabody, Mass.) -- From the exhibition hall at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico, JEOL USA will demonstrate – via remote operation – three of its more than 30 JEOL TEMs currently using Sirius™ Remote TEM software and internet or wireless connections. Visitors to the booth will be able to perform real-time operation of the JEM-2200FS Aberration-corrected TEMs at Oak Ridge National Laboratory in Tennessee and Lehigh ...