JEOL USA Press Releases

July 31, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F, at M&M 2008 in Albuquerque, New Mexico in its booth #1027. Featuring the highest beam current available on any FEG SEM, the JSM-7600F integrates a semi-in-lens objective lens with an in-lens thermal electron gun, providing superior imaging of nonconductive samples that traditionally charge, such as photomasks, ceramics, and glass. This ...

July 30, 2008 (Peabody, Mass.) -- JEOL USA will demonstrate both of its new MultiBeam SEM/FIB instruments in a special exhibit area dedicated to its ion beam “power tools” at M&M 2008. The LaB6 model, the JIB-4500 MultiBeam, was introduced in December 2007 and has already gained wide acceptance, with recent installations at nanotechnology research centers at Boston College and the University of Southern California. A new Field Emission MultiBeam, the model JIB-4600F, will debut ...

July 28, 2008 (Peabody, Mass.) -- JEOL USA will host a tutorial session at M&M 2008 in conjunction with Oak Ridge National Laboratory (ORNL) and Protochips to introduce PRISM – Practical Remote In Situ Microscopy. The PRISM tutorial will be held on Monday, August 4, 2008 at the Microscopy & Microanalysis (M&M) Exhibit in Albuquerque, New Mexico in the JEOL booth #1027 at 5:30 p.m. PRISM is a technique made possible by the remote operation ...

July 28, 2008 (Peabody, MA) -- JEOL, the global leader in electron microscopy for nearly 60 years, will demonstrate a variety of new software packages for its 120kV to 300kV series of Transmission Electron Microscopes (TEMs) in booth #1027 at the M&M 2008 Microscopy and Microanalysis exhibit in Albuquerque, New Mexico from August 4-7. Exploring the frontiers of electron microscopy, scientists using JEOL TEMs accelerate research advances and boost productivity with a suite of recently ...

See the new JEOL lineup: Power Tools for Microscopy and Sample Processing

With a legacy of commitment to customer support, JEOL USA is pleased to accept its 8th award in as many years for excellence in customer satisfaction as judged by our customers. The Omega NorthFace ScoreBoard Award was presented in May at Boston’s World Trade Center to 27 qualifying companies, including JEOL and three other companies that qualified for eight consecutive years. “The NorthFace ScoreBoard Awards recognize organizations who not only offer exemplary customer service, but ...

May 13, 2008 (Peabody, Mass.) -- JEOL USA has published the fourth edition of its popular collection of applications notes for open air mass spectrometry. The AccuTOF-DART Applications Notebook 4th edition is updated to include several new applications notes covering topics as diverse as real-time analysis of deoxynivalenol in beer to GC/MS using the DART™ ion source. The new book includes 58 pages of real-time analysis of pharmaceuticals, drugs in dose form or in ...

March 3, 2008 (Pittcon 2008, New Orleans, LA) -- Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market. The two companies will jointly introduce the NeoScope at Pittcon 2008, March 3-6, in New Orleans, Louisiana. “The NeoScope partnership is a natural progression for both companies,” said Michael Metzger, General Manager of Sales and Marketing at Nikon Instruments in ...

Introduction In a recently published comparison1 of the ambient ionization techniques direct analysis in real time (DART™ 2) and DESI3, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental conditions for DART than were used for the other two techniques. Mass spectra of aspirin measured on a JEOL AccuTOF-DART™ ...

January 15, 2007 (Peabody, Mass.) -- JEOL USA announced today that Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts. As a result of Boston College’s continued investment in the sciences, the university opened its first clean room (class 1,000/10,000), which will be equipped with the JEOL models JIB-4500 MultiBeam and JSM-7001F Scanning Electron Microscope with ...