JEOL USA Press Releases

(February 7, 2023 Peabody, Mass.) --  JEOL Electron Microscopes, Nuclear Magnetic Resonance Spectrometers, and Mass Spectrometers are used for research in nearly every scientific discipline including life sciences, materials science, forensics, and drug discovery.  At Pittcon 2023 (March 18-22), JEOL will focus on “The Science of Energy” with specialized imaging and analysis solutions for researchers who are developing battery materials, including Lithium-ion batteries. JEOL technology is also helping researchers to improve petroleum, solar, and ...

February 1, 2023 – Peabody, MA JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. High Quality Fast TEM Sample Preparation The new FIB sample stage offers fast transitioning between processing and imaging, allowing for real-time feedback of specimen ...

August 1, 2022 (M&M 2022 Portland, Oregon) JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the entire EDS range produced from the IT800 series Field Emission SEMs including low-energy X-rays down to Lithium. It is fully ...

(May 2, 2022, Peabody, Mass.) JEOL USA enters a new era of innovation with the introduction of metal additive manufacturing technology into North America backed by an extensive service and support network. JEOL, Ltd. (Tokyo, Japan) has entered the equipment production phase for the JEOL JAM-5200EBM, a new Electron Beam Melting (EBM) powder bed fusion machine that significantly improves productivity, quality, and reliability to produce stronger and lighter parts for a variety of applications. JEOL EBM ...

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) ...

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services. December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and ...

Materials science researchers in Japan have achieved extraordinary in-situ Transmission Electron Microscope (TEM) experiments using a new Luminary Micro laser technique. They succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures. The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles. This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system ...

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including: - Connectomics and the study of complete volumes of tissues or materials captured at high resolution - Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small ...

April 19, 2021 Peabody, Mass. -- JEOL USA welcomes a new Managing Director, Dr. Hidetaka Sawada, to its Peabody, Massachusetts office this April. Dr. Sawada is a world-renowned expert in aberration corrected electron microscopy. Most recently he served as General Manager of the Technical and Development group in the Electron Microscopy Business Unit of JEOL, Ltd. in Akishima, Japan. Dr. Sawada’s expertise includes the development and installation of the aberration-corrected (Cs) Transmission Electron Microscopes for ...

April 1, 2021 Peabody, Mass -- JEOL, the leading supplier of electron microscopes in North and South America, begins a new partnership on April 1st, 2021 with SOQUELEC LTD., a Montreal, Quebec company with more than 40 years of experience specializing in sales of scientific instruments. SOQUELEC will serve as the sales representative agency for JEOL’s electron microscope product line throughout all of Canada. JEOL will benefit from SOQUELEC’s expanded sales team in the ...