JEOL USA Press Releases

JEOL USA Press Releases

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JEOL USA Press Releases


JEOL Webmaster
JEOL Webmaster
JEOL Webmaster's Blog

March 13, 2013 (Peabody, MA) -- JEOL's latest mass spec instrumentation, NMR technology, and analytical scanning electron microscopes (SEM) will be on display at Pittcon 2013 in Philadelphia, PA, March 18-21 in booth 2224. The new AccuTOF GCv 4G mass spectrometer, the NeoScope Benchtop Scanning Electron Microscope (SEM) and the InTouchScope SEM will be in the booth #2224. Technical experts will be in the booth and also presenting during two key events. JEOL will ...

October 25, 2012 (Peabody, MA) -- A new application note from JEOL demonstrates that high mass resolving power can be maintained for matrix-assisted laser desorption ionization (MALDI) imaging of biological specimens by using a TOF system with a very long flight path. The JEOL SpiralTOF MALDI TOF/TOF mass spectrometer has unique multi-turn ion optics that pack a 17-meter flight path into a compact 1-meter mass analyzer. The instrument is capable of a resolving power of ...

August 3, 2012 (Peabody, Mass.) – JEOL’s newest AccuTOF GCv model - the “4G” - now offers even faster data acquisition rates and higher resolving power than its predecessor. The AccuTOF-GCv|4G has a maximum data acquisition rate of 50 spectra per second and a resolving power of 8000. The 50 Hz acquisition rate now makes it possible to acquire high-resolution mass spectra in combination with third party two-dimensional GC (GC×GC). The AccuTOF-GCv|4G offers the ...

July 26, 2012 (Peabody, Mass.) – A new Applications Notebook from JEOL features over 20 application notes describing the analysis of synthetic polymers, small organic molecules, complex drug mixtures, peptides, and proteins using the JEOL SpiralTOFTM MALDI TOF-TOF mass spectrometer. The SpiralTOF time-of-flight optics design utilizes a figure-eight ion trajectory to allow a 17m flight path to fit in an extremely small console. This exceptionally long flight path results in an ultrahigh resolving ...

July 10, 2012 (Semicon West, San Francisco, CA) -- Since its initial introduction in 2008, the JEOL NeoScope benchtop Scanning Electron Microscope (SEM), represented by Nikon Instruments, has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection, and imaging insects for student projects. It is also used in conjunction with both optical microscopes and traditional SEMs in the lab. Now JEOL introduces the NeoScope with higher magnification, multi-touch screen control, and a sleek ...

May 31, 2012 (Peabody, Mass.) -- JEOL's new series of field emission scanning electron microscopes is now complete with the introduction of the sub-nanometer imaging resolution JSM-7800F. The JSM-7800F represents a significant leap forward in Field Emission SEM technology, with unmatched resolution and stability for nanotechnology imaging and analysis. JEOL's highest performance FE-SEM makes it possible to: observe the finest structural morphology of nanomaterials at 1,000,000X magnification with sub-1nm resolution perform low kV imaging and analysis of ...

April 17, 2012 (Peabody, Mass.) -- JEOL launches a new series of Field Emission Scanning Electron Microscopes (FE-SEM) that offer expanded imaging and analysis capabilities customizable to performance requirements. The JEOL JSM-7100F series offers sub-1 nm imaging capabilities and analytical characterization at the sub-100nm scale, accomplished through the combination of large beam currents with a small probe size at any accelerating voltage. Designed for the budget-conscious lab, the JSM-7100F model is a highly versatile, easy-to-use ...

110kHz Magic Angle Spinning, a record for spinning speed with JEOL Resonance’s new 0.75 mm Solid State NMR Probe April 11, 2012 (Miami, Florida) -- JEOL Resonance, Inc., headquartered in Akishima, Tokyo, will announce a new 0.75 mm solid state NMR probe at the 53rd Experimental Nuclear Magnetic Resonance Conference that opens on April 15, 2012 in Miami, Florida. The probe is capable of high resolution sample analysis by spinning the sample at 110 kHz, ...

November 10, 2011 (Peabody, Mass.) JEOL USA, a leading supplier of scientific instruments in the Americas, was honored by a visit from the Consul General of Japan in Boston, Mr. Takeshi Hikihara, on Wednesday, November 9, 2011. As a representative of the Foreign Ministry, Mr. Hikihara serves Japanese communities and businesses throughout New England. JEOL USA was incorporated in the U.S. in 1962 and is a wholly-owned subsidiary of JEOL, Ltd which is headquartered ...

October 20, 2011 (Peabody, Mass.) -- JEOL USA Mass Spectrometry Product Manager, Dr. Robert (Chip) Cody, has received the prestigious Anachem Award, given by the Association of Analytical Chemistry for his contributions to the development of organic mass spectrometry. The award was presented at the Federation of Analytical Chemical and Spectroscopy Societies (FACSS) meeting in Las Vegas, Nevada, where Dr. Cody gave a plenary lecture entitled Massive Changes: Not just your grandma's mass spectrometer ...